EIA 364-23-C-2006 (R2017)

$22.75

Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets

Published By	Publication Date	Number of Pages
ECIA	2006	12

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Category: ECIA

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Description

This set procedure may apply to any type or combination of
current carrying members such as pin and socket contacts, relay
contacts, wire and crimp connectors, or printed circuit board and
contact.

Object

The object of this test procedure is to detail a standard method
a measure the electrical resistance of two current carrying members
in mutual contact. This test procedure specifies test voltages that
will not disturb insulating films on the contacting surface nor
cause asperity melting. This procedure addresses the effect of
thermal EMF's, source of measurement error.

Additional information