BS QC 720100:1991
$102.76
Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices
Published By | Publication Date | Number of Pages |
BSI | 1991 | 18 |
Test and measurement procedures, inspection requirements together with associated screening and sampling requirements, and quality assessment procedures to be used in preparing detail specifications for optoelectronic devices in accordance with the appropriate blank detail specification.