BS EN 60749-17:2003:2004 Edition
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Semiconductor devices. Mechanical and climatic test methods – Neutron irradiation
Published By | Publication Date | Number of Pages |
BSI | 2004 | 10 |
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Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
Status | Withdrawn |
---|---|
Title | Semiconductor devices. Mechanical and climatic test methods – Neutron irradiation |
Corrects | BS EN 60749-17:2003 |
Publisher | BSI |
Committee | EPL/47 |
Pages | 10 |
Publication Date | 2004-06-29 |
Withdrawn Date | 2019-05-15 |
Replaced By | BS EN IEC 60749-17:2019 |
ISBN | 0 580 42063 9 |
Standard Number | BS EN 60749-17:2003 |
Identical National Standard Of | EN 60749-17:2003, IEC 60749-17:2003 |
Descriptors | Irradiation, Electronic equipment and components, Destructive testing, Climate, Neutrons, Military equipment, Integrated circuits, Military engineering, Dosimeters, Radiation measurement, Environmental testing, Mechanical testing, Nuclear particles, Space technology components, Degradation, Semiconductor devices |
ICS Codes | 31.080.01 - Semiconductor devices in general |
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