BS EN 60195:2016
$167.15
Method of measurement of current noise generated in fixed resistors
| Published By | Publication Date | Number of Pages |
| BSI | 2016 | 36 |
IEC 60195:2016 specifies a method of measurement and associated test conditions to assess the “noisiness”, or magnitude of current noise, generated in fixed resistors of any given type. The method applies to all classes of fixed resistors. The aim is to provide comparable results for the determination of the suitability of resistors for use in electronic circuits having critical noise requirements. This edition includes the following significant technical changes with respect to the previous edition: – harmonization of the allocation of isolation resistors R M in the recommended operating conditions given in Table 2; – correction of erroneous numeric values of the contribution of system noise, f(T – S) in Table 3; – addition of advice on the prescription of requirements in a relevant component specification; – addition of a set of recommended measuring conditions for specimens with a rated dissipation of less than 100 mW; – complete editorial revision.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | English CONTENTS |
| 8 | FOREWORD |
| 10 | 1 Scope 2 Normative references 3 Terms and definitions |
| 11 | 4 Method of measurement 4.1 Noise basics 4.1.1 Noise |
| 12 | 4.1.2 Thermal noise 4.1.3 Current noise |
| 13 | 4.2 Measurement principle |
| 14 | 4.3 Measurement system 4.3.1 Proposal of a suitable measuring system |
| 15 | 4.3.2 Alternative measuring systems 4.4 Measurement system requirements 4.4.1 Input circuit Figures Figure 1 – Block schematic of a suitable measuring system |
| 16 | 4.4.2 Isolation resistor RM 4.4.3 DC voltage source 4.4.4 DC electronic voltmeter 4.4.5 Calibration resistor RCal |
| 17 | 4.4.6 Calibration source 4.4.7 Determination of the calibration voltage |
| 19 | 4.4.8 AC band-pass amplifier |
| 20 | 4.4.9 AC r.m.s. meter 4.4.10 Test fixture Figure 2 – Typical transfer function of the band-pass amplifier |
| 21 | 4.5 Verification of the measuring system 4.5.1 Performance check by measurement of instrument and thermal noise 4.5.2 Performance check by comparison of repeated measurements Tables Table 1 – Permissible limits of system noise |
| 22 | 5 Measurement procedure 5.1 Ambient conditions 5.2 Preparation of specimen 5.3 Procedure 5.3.1 General 5.3.2 Calibration 5.3.3 Measurement of system noise S |
| 23 | 5.3.4 Measurement of total noise T |
| 24 | Table 2 – Recommended operating conditions (1 of 2) |
| 26 | 5.4 Precautions 6 Evaluation of measurement results 6.1 Term for the contribution of system noise |
| 27 | Figure 3 – Contribution of system noise, f(T – S) |
| 28 | 6.2 Determination of the current-noise index A1 Table 3 – Numeric values of the contribution of system noise, f(T – S) |
| 29 | 6.3 Determination of the current-noise voltage ratio CNRU |
| 30 | 6.4 Accuracy 6.5 Requirements 7 Information to be given in the relevant component specification |
| 31 | Annex A (informative) Letter symbols and abbreviations A.1 Letter symbols A.2 Abbreviations |
| 32 | Annex X (informative) Cross-reference for references to the prior revision of this standard Table X.1 – Cross reference for references to the 1st edition of this standard |
| 33 | Bibliography |
