BS EN 169000:1993

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Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators

Published By	Publication Date	Number of Pages
BSI	1993	70

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Description

Specifies methods of test and general requirements for oscillators of assessed quality using either capability approval or qualification approval procedures.

Additional information

Status	Definitive
Title	Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators
Replaces	BS 9620:1975
Publisher	BSI
Committee	W/-
Pages	70
Publication Date	1993-08-15
Replaced By	BS EN 60679-1:1998
ISBN	0 580 22443 0
Standard Number	BS EN 169000:1993
Identical National Standard Of	EN 169000:1992
Descriptors	Approval testing, Endurance testing, Testing conditions, Electrical wave measurement, Electric distortion, Qualification approval, Visual inspection (testing), Frequency modulation, Ratings, Capability approval, Noise (spurious signals), Oscillators, Impedance measurement, Voltage measurement, Frequency measurement, Environmental testing, Leak tests, Quality assurance systems, Pulse modulation, Crystal resonators, Radiofrequencies, Performance testing, Amplitude modulation, Logic circuits, Resistance measurement, Marking, Electrical insulation, Time, Sensitivity, Definitions, Circuits, Dielectric devices, Assessed quality, Electronic equipment and components, Inspection, Frequencies, Stability, Power measurement (electric), Electrical testing, Piezoelectric devices, Mechanical testing, Phase (electric)
ICS Codes	31.140 - Piezoelectric devices

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BS EN 169000:1993

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