BS CECC 90000:Addendum No. 1:1983
$189.07
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits. Internal visual inspection
| Published By | Publication Date | Number of Pages |
| BSI | 1983 | 50 |
| Status | Definitive |
|---|---|
| Pages | 50 |
| Publication Date | 1983-07-29 |
| ISBN | 0 580 13357 5 |
| Standard Number | BS CECC 90000:Addendum No. 1:1983 |
| Title | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits. Internal visual inspection |
| Identical National Standard Of | CECC 90000 |
| Descriptors | Defects, Particle size distribution, Assessed quality, Specification (approval), Passivation, Microscopic analysis, Circuits, Quality control, Approval testing, Metallizing, Monolithic integrated circuits, Surface defects, Qualification approval, Integrated circuits, Visual inspection (testing), Inspection, Quality assurance systems, Testing conditions, Electronic equipment and components |
| Publisher | BSI |
| Committee | EPL/47 |
| ICS Codes | 31.200 - Integrated circuits. Microelectronics |
