Name: BS CECC 00013:1985 PDF - PDF Standards Store
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BS CECC 00013:1985

$142.49

Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice

Published By	Publication Date	Number of Pages
BSI	1985	24

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Status	Withdrawn
Pages	24
Publication Date	1985-08-30
Withdrawn Date	2009-11-04
ISBN	0 580 14602 2
Standard Number	BS CECC 00013:1985
Title	Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
Identical National Standard Of	CECC 00013
Descriptors	Approval testing, Non-destructive testing, Assessed quality, Semiconductor technology, Specification (approval), Microscopic analysis, Integrated circuit technology, Electronic equipment and components, Semiconductor devices, Quality control, Quality assurance systems, Inspection, Specimen preparation, Semiconductors, Testing conditions, Test equipment, Statistical quality control, Electron microscopes, Sampling methods, Integrated circuits
Publisher	BSI
Committee	W/-
ICS Codes	31.080.01 - Semiconductor devices in general


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BS CECC 00013:1985

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