{"id":396226,"date":"2024-10-20T04:23:37","date_gmt":"2024-10-20T04:23:37","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1149-4-1999\/"},"modified":"2024-10-26T08:10:40","modified_gmt":"2024-10-26T08:10:40","slug":"ieee-1149-4-1999","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1149-4-1999\/","title":{"rendered":"IEEE 1149.4-1999"},"content":{"rendered":"

New IEEE Standard – Superseded. The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nTitle Page <\/td>\n<\/tr>\n
3<\/td>\nIntroduction
Participants <\/td>\n<\/tr>\n
5<\/td>\nCONTENTS <\/td>\n<\/tr>\n
7<\/td>\n1. Overview
1.1 Organization of the standard
1.2 Context <\/td>\n<\/tr>\n
8<\/td>\n1.3 Scope of the standard <\/td>\n<\/tr>\n
11<\/td>\n1.4 Background reading
2. References <\/td>\n<\/tr>\n
12<\/td>\n3. Definitions, acronyms, and voltage symbols
3.1 Definitions <\/td>\n<\/tr>\n
15<\/td>\n3.2 Acronyms <\/td>\n<\/tr>\n
16<\/td>\n3.3 Voltage source symbols
4. Testability architecture
4.1 Overview <\/td>\n<\/tr>\n
18<\/td>\n4.2 TAP controller <\/td>\n<\/tr>\n
19<\/td>\n4.3 ATAP
4.4 Register architecture <\/td>\n<\/tr>\n
21<\/td>\n5. Instructions
5.1 General
5.2 Response of test logic to instructions <\/td>\n<\/tr>\n
22<\/td>\n5.3 Mandatory instructions <\/td>\n<\/tr>\n
24<\/td>\n5.4 Optional instructions <\/td>\n<\/tr>\n
29<\/td>\n6. The TBIC
6.1 General <\/td>\n<\/tr>\n
30<\/td>\n6.2 Test bus and TBIC structure <\/td>\n<\/tr>\n
34<\/td>\n6.3 Control of the TBIC <\/td>\n<\/tr>\n
37<\/td>\n6.4 Differential I\/O
6.5 Partitioned internal test bus structure <\/td>\n<\/tr>\n
41<\/td>\n7. The boundary-scan structure
7.1 Structure <\/td>\n<\/tr>\n
42<\/td>\n7.2 DBMs <\/td>\n<\/tr>\n
44<\/td>\n7.3 ABMs <\/td>\n<\/tr>\n
53<\/td>\n7.4 Differential ABMs <\/td>\n<\/tr>\n
58<\/td>\n8. Measurement methodology
8.1 Interconnect testing <\/td>\n<\/tr>\n
61<\/td>\n8.2 Extended interconnect testing <\/td>\n<\/tr>\n
65<\/td>\n8.3 Network measurements <\/td>\n<\/tr>\n
66<\/td>\n9. Analog parametric limits
9.1 General
9.2 Switch limitations <\/td>\n<\/tr>\n
67<\/td>\n9.3 Electrostatic protection <\/td>\n<\/tr>\n
68<\/td>\n9.4 Performance specifications <\/td>\n<\/tr>\n
70<\/td>\n9.5 Measuring performance <\/td>\n<\/tr>\n
76<\/td>\n9.6 Calibration and errors <\/td>\n<\/tr>\n
79<\/td>\n10. Conformance and documentation
10.1 Conformance
10.2 General documentation <\/td>\n<\/tr>\n
83<\/td>\n10.3 Documentation of residual elements <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard for a Mixed-Signal Test Bus<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n1999<\/td>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":396234,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-396226","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/396226","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/396234"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=396226"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=396226"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=396226"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}