{"id":359488,"date":"2024-10-20T01:26:22","date_gmt":"2024-10-20T01:26:22","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iso-25178-6002019\/"},"modified":"2024-10-26T02:08:21","modified_gmt":"2024-10-26T02:08:21","slug":"bs-en-iso-25178-6002019","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iso-25178-6002019\/","title":{"rendered":"BS EN ISO 25178-600:2019"},"content":{"rendered":"
This document specifies the metrological characteristics of areal instruments for measuring surface topography. Because surface profiles can be extracted from surface topography images, most of the terms defined in this document can also be applied to profiling measurements.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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2<\/td>\n | National foreword <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | European foreword <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions 3.1 All areal topography measuring methods <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 3.2 x- and y-scanning systems <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 3.3 Optical systems <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 3.4 Optical properties of the workpiece <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 4 Standard metrological characteristics for surface texture measurement <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | Annex A (informative) Maximum measurable local slope vs. AN <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | Annex B (informative) Relation to the GPS matrix model <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Geometrical product specifications (GPS). Surface texture: Areal – Metrological characteristics for areal topography measuring methods<\/b><\/p>\n |