{"id":301945,"date":"2024-10-19T20:37:18","date_gmt":"2024-10-19T20:37:18","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-dd-iso-ts-107982011\/"},"modified":"2024-10-25T18:07:13","modified_gmt":"2024-10-25T18:07:13","slug":"bsi-dd-iso-ts-107982011","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-dd-iso-ts-107982011\/","title":{"rendered":"BSI DD ISO\/TS 10798:2011"},"content":{"rendered":"

This Technical Specification establishes methods to characterize the morphology, and to identify the elemental composition of, catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis.<\/p>\n

The methods described here for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
9<\/td>\n1 Scope
2 Normative references
3 Terms and definitions
3.1 Terms related to scanning electron microscope <\/td>\n<\/tr>\n
10<\/td>\n3.2 Terms related to electron probe microanalysis <\/td>\n<\/tr>\n
11<\/td>\n3.3 Terms related to sampling <\/td>\n<\/tr>\n
12<\/td>\n4 General principles
4.1 SEM analysis
4.2 EDX analysis
4.3 Applicability to MWCNT analysis <\/td>\n<\/tr>\n
13<\/td>\n4.4 Other supportive analytical methods
5 Sample preparation methods
5.1 Precautions and safety concerns
5.2 Preparing samples for SEM\/EDX analysis
5.2.1 Sample preparation protocols
5.2.2 Sample selection <\/td>\n<\/tr>\n
14<\/td>\n5.2.3 Types of CNT samples
5.3 SEM sample preparation\/attachment techniques
5.3.1 Double-sided carbon tape method (dry method)
5.3.2 Pressing powder into indium foil (dry method) <\/td>\n<\/tr>\n
15<\/td>\n5.3.3 Solvent dispersion on suitable substrates (wet method)
6 Measurement procedures
6.1 SEM analysis <\/td>\n<\/tr>\n
16<\/td>\n6.2 EDX analysis <\/td>\n<\/tr>\n
17<\/td>\n7 Data analysis and results interpretation
7.1 SEM results
7.2 EDX results
8 Measurement uncertainty
8.1 SEM analysis <\/td>\n<\/tr>\n
18<\/td>\n8.2 EDX analysis <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2011<\/td>\n38<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":301951,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-301945","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/301945","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/301951"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=301945"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=301945"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=301945"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}