{"id":230715,"date":"2024-10-19T15:00:52","date_gmt":"2024-10-19T15:00:52","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-60384-222012\/"},"modified":"2024-10-25T09:17:18","modified_gmt":"2024-10-25T09:17:18","slug":"bs-en-60384-222012","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-60384-222012\/","title":{"rendered":"BS EN 60384-22:2012"},"content":{"rendered":"

IEC 60384-22:2011 is applicable to fixed unencapsulated surface mount multilayer capacitors of ceramic dielectric, Class 2, for use in electronic equipment. These capacitors have metallized connecting pads or soldering strips and are intended to be mounted on printed boards, or directly onto substrates for hybrid circuits. Capacitors for electromagnetic interference suppression are not included, but are covered by IEC 60384-14. The object of this standard is to prescribe preferred ratings and characteristics and to select from IEC 60384-1 the appropriate quality assessment procedures, tests and measuring methods and to give general performance requirements for this type of capacitor. Test severities and requirements prescribed in detail specifications referring to this sectional specification should be of equal or higher performance level, lower performance levels are not permitted. This second edition cancels and replaces the first edition published in 2004 and contains the following significant technical changes with respect to the previous edition. – The measuring frequency of 1 MHz has been reduced to 1 kHz for 100 pF, see 4.5.1 Capacitance. – The test voltage of 1,2 U<\/i> R<\/sub> at U<\/i> R<\/sub> greater or equal to 1 000 V has been added in 4.5.4 Voltage proof. – Detail test conditions have been added in 4.7 Shear test and 4.8 Substrate bending test. – Test conditions applying lead free solder alloy (Sn-Ag-Cu) have been included in 4.9 Resistance to soldering heat and 4.10 Solderability. – A selection of the test conditions according to marketing needs has been stated in 4.13 Damp heat, steady state. – The dimensions of 0402 M in Annex A have been added. – The temperature characteristics code of capacitance for the reference temperature of 25 \u00b0C has been added, see Annex C.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
6<\/td>\nEnglish
CONTENTS <\/td>\n<\/tr>\n
10<\/td>\n1 General
1.1 Scope
1.2 Object
1.3 Normative references
1.4 Information to be given in a detail specification <\/td>\n<\/tr>\n
12<\/td>\n1.5 Terms and definitions
1.6 Marking <\/td>\n<\/tr>\n
13<\/td>\n2 Preferred rating and characteristics
2.1 Preferred characteristics <\/td>\n<\/tr>\n
14<\/td>\n2.2 Preferred values of ratings
Tables
Table 1 \u2013 Preferred values of category voltages <\/td>\n<\/tr>\n
15<\/td>\nTable 2 \u2013 Preferred tolerances
Table 3 \u2013 Temperature characteristic of capacitance <\/td>\n<\/tr>\n
16<\/td>\n3 Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Certified records of released lots
3.4 Qualification approval <\/td>\n<\/tr>\n
18<\/td>\nTable 4 \u2013 Fixed sample size test plan for qualification approval, assessment level EZ <\/td>\n<\/tr>\n
19<\/td>\nTable 5 \u2013 Tests schedule for qualification approval <\/td>\n<\/tr>\n
22<\/td>\n3.5 Quality conformance inspection <\/td>\n<\/tr>\n
23<\/td>\nTable 6a \u2013 Lot-by-lot inspection
Table 6b \u2013 Periodic test <\/td>\n<\/tr>\n
24<\/td>\n4 Test and measurement procedures
4.1 Special preconditioning
4.2 Measuring conditions
4.3 Mounting
4.4 Visual examination and check of dimensions <\/td>\n<\/tr>\n
25<\/td>\nFigures
Figure 1 \u2013 Fault: crack or fissure
Figure 2 \u2013 Fault: crack or fissure
Figure 3 \u2013 Separation or delamination
Figure 4 \u2013 Exposed electrodes <\/td>\n<\/tr>\n
26<\/td>\n4.5 Electrical tests
Figure 5 \u2013 Principal faces
Table 7 \u2013 Measuring conditions <\/td>\n<\/tr>\n
27<\/td>\nTable 8 \u2013 Tangent of loss angle limits <\/td>\n<\/tr>\n
28<\/td>\nTable 9 \u2013 Test voltages <\/td>\n<\/tr>\n
29<\/td>\n4.6 Temperature characteristic of capacitance
Table 10 \u2013 Details of measuring conditions <\/td>\n<\/tr>\n
30<\/td>\n4.7 Shear test
4.8 Substrate bending test <\/td>\n<\/tr>\n
31<\/td>\n4.9 Resistance to soldering heat <\/td>\n<\/tr>\n
32<\/td>\nFigure 6 \u2013 Reflow temperature profile
Table 11 \u2013 Reflow temperature profiles for Sn-Ag-Cu alloy <\/td>\n<\/tr>\n
33<\/td>\n4.10 Solderability
Table 12 \u2013 Maximum capacitance change <\/td>\n<\/tr>\n
34<\/td>\n4.11 Rapid change of temperature <\/td>\n<\/tr>\n
35<\/td>\n4.12 Climatic sequence
Table 13 \u2013 Maximum capacitance change
Table 14 \u2013 Number of damp heat cycles <\/td>\n<\/tr>\n
36<\/td>\n4.13 Damp heat, steady state
Table 15 \u2013 Final inspection, measurements and requirements <\/td>\n<\/tr>\n
37<\/td>\n4.14 Endurance
Table 16 \u2013 Test conditions for damp heat, steady state
Table 17 \u2013 Final inspection, measurements and requirements <\/td>\n<\/tr>\n
38<\/td>\nTable 18 \u2013 Endurance test conditions (UC = UR)
Table 19 \u2013 Endurance test conditions (UC \u2260 UR) <\/td>\n<\/tr>\n
39<\/td>\n4.15 Robustness of terminations (only for capacitors with strip termination)
4.16 Component solvent resistance (if required)
4.17 Solvent resistance of the marking (if required)
4.18 Accelerated damp heat, steady state (if required)
Table 20 \u2013 Final inspection, measurements and requirements of endurance test <\/td>\n<\/tr>\n
40<\/td>\nTable 21 \u2013 Initial requirements
Table 22 \u2013 Conditioning <\/td>\n<\/tr>\n
41<\/td>\nAnnex A (normative) Guidance for the specification and coding of dimensions of fixed surface mount multilayer capacitors of ceramic dielectric, Class 2
Figure A.1 \u2013 Dimensions
Table A.1 \u2013 Dimensions <\/td>\n<\/tr>\n
42<\/td>\nAnnex B (informative) Capacitance ageing of fixed capacitors of ceramic dielectric, Class 2 <\/td>\n<\/tr>\n
44<\/td>\nAnnex C (informative) Temperature characteristics of capacitance for the reference temperature of 25 \u00b0C
Table C.1 \u2013 Temperature characteristics of capacitance for the reference temperature of 25 \u00b0C
Table C.2 \u2013 Measuring conditions of temperature characteristic of capacitance for the reference temperature of 25\u00a0\u00b0C <\/td>\n<\/tr>\n
45<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Fixed capacitors for use in electronic equipment – Sectional specification. Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2012<\/td>\n48<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":230718,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[564,2641],"product_tag":[],"class_list":{"0":"post-230715","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-060-10","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/230715","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/230718"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=230715"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=230715"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=230715"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}