{"id":154773,"date":"2024-10-19T09:12:45","date_gmt":"2024-10-19T09:12:45","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-c57-157-2015\/"},"modified":"2024-10-25T01:28:12","modified_gmt":"2024-10-25T01:28:12","slug":"ieee-c57-157-2015","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-c57-157-2015\/","title":{"rendered":"IEEE C57.157 2015"},"content":{"rendered":"

New IEEE Standard – Active. This guide is intended for use in establishing a methodology to evaluate expected long-term performance of infrequently operated switch contacts used within insulating liquidimmersed transformers. These switch contacts are typically found in de-energized tapchangers, dual voltage switches, reversing switches, on-load tapchangers, and step-voltage regulators, but the test might possibly be used to evaluate any contact that is used in insulating liquids with similar operating characteristics and within similar environments.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nIEEE Std C57.157\u2122-2015 Front Cover <\/td>\n<\/tr>\n
3<\/td>\nTitle page <\/td>\n<\/tr>\n
5<\/td>\nImportant Notices and Disclaimers Concerning IEEE Standards Documents <\/td>\n<\/tr>\n
8<\/td>\nParticipants <\/td>\n<\/tr>\n
10<\/td>\nIntroduction <\/td>\n<\/tr>\n
11<\/td>\nContents <\/td>\n<\/tr>\n
12<\/td>\nIMPORTANT NOTICE
1. Overview
1.1 Scope
1.2 Purpose <\/td>\n<\/tr>\n
13<\/td>\n2. Normative references
3. Definitions
4. Background <\/td>\n<\/tr>\n
14<\/td>\n4.1 Basis of 10 \u00b0C rule and application of Arrhenius relationship
4.2 Incorporation in test of IEEE transformer loading guide
4.3 Incorporation in test of typical daily load cycle <\/td>\n<\/tr>\n
15<\/td>\n4.4 Derivation of desired aging temperatures <\/td>\n<\/tr>\n
16<\/td>\n4.5 Application of specific switch characteristics to test
5. General test setup
5.1 Safety considerations
5.2 Items for test <\/td>\n<\/tr>\n
17<\/td>\n5.3 Monitoring locations <\/td>\n<\/tr>\n
20<\/td>\n6. Test procedure
7. Test data recording <\/td>\n<\/tr>\n
21<\/td>\n8. Pass\/fail criteria <\/td>\n<\/tr>\n
22<\/td>\nAnnex A (informative) Bibliography <\/td>\n<\/tr>\n
23<\/td>\nAnnex B (informative) Contact aging phenomenon in insulating liquid <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Guide for Conducting Functional Life Tests on Switch Contacts Used in Insulating Liquid–Immersed Transformers<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2015<\/td>\n26<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":154775,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-154773","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/154773","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/154775"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=154773"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=154773"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=154773"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}