{"id":111304,"date":"2024-10-18T16:08:59","date_gmt":"2024-10-18T16:08:59","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-c62-37-1996\/"},"modified":"2024-10-24T22:01:01","modified_gmt":"2024-10-24T22:01:01","slug":"ieee-c62-37-1996","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-c62-37-1996\/","title":{"rendered":"IEEE C62.37 1996"},"content":{"rendered":"

New IEEE Standard – Active. This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nTitle page <\/td>\n<\/tr>\n
3<\/td>\nIntroduction <\/td>\n<\/tr>\n
4<\/td>\nParticipants <\/td>\n<\/tr>\n
6<\/td>\nCONTENTS <\/td>\n<\/tr>\n
7<\/td>\n1. Overview
1.1 Scope
1.2 Tests
1.3 Applicability and device function <\/td>\n<\/tr>\n
8<\/td>\n2. Definitions of rated and other parameters
2.1 Rated parameter values
2.2 Definitions <\/td>\n<\/tr>\n
9<\/td>\n2.3 Additional definitions <\/td>\n<\/tr>\n
10<\/td>\n2.4 Temperature dependence of parameters <\/td>\n<\/tr>\n
11<\/td>\n2.5 Gated thyristor surge protection device (SPD) <\/td>\n<\/tr>\n
16<\/td>\n3. Service condition
3.1 Normal service conditions <\/td>\n<\/tr>\n
17<\/td>\n3.2 Unusual service conditions
4. Standard design test procedure
4.1 Standard design test criteria <\/td>\n<\/tr>\n
18<\/td>\n4.2 Statistical analysis
4.3 Thyristor surge protection device (SPD) test conditions <\/td>\n<\/tr>\n
19<\/td>\n4.4 Rating test proecdures <\/td>\n<\/tr>\n
24<\/td>\n4.5 Characteristic test procedures <\/td>\n<\/tr>\n
49<\/td>\n5. Failure modes
5.1 Degradation failure mode
5.2 Catastrophic failure mode <\/td>\n<\/tr>\n
50<\/td>\n5.3 “Fail-safe” operation <\/td>\n<\/tr>\n
51<\/td>\nAnnex A\u2014Thyristor terms <\/td>\n<\/tr>\n
56<\/td>\nAnnex B\u2014Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n1997<\/td>\n56<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":111305,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-111304","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/111304","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/111305"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=111304"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=111304"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=111304"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}