ISO 9455-17:2002
$36.40
Soft soldering fluxes — Test methods — Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues
Published By | Publication Date | Number of Pages |
ISO | 2002-12 | 26 |
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ISO 9455-17:2002 specifies a method of testing for deleterious effects that may arise from flux residues after soldering or tinning test coupons. The test is applicable to type 1 and type 2 fluxes in solid or liquid form, or in the form of flux-cored solder wire, solder preforms or solder paste constituted with eutectic or near-eutectic tin/lead solders.
This test method is also applicable to fluxes for use with lead-free solders. However, the soldering temperatures may be adjusted with agreement between tester and customer.
Published Code | ISO |
---|---|
Published By | International Organization for Standardization |
Publication Date | 2002-12 |
Pages Count | 26 |
Language | France |
Edition | 1 |
File Size | 819.2 KB |
ICS Codes | 25.160.50 - Brazing and soldering |
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