IEEE 1671.5-2008
$30.88
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
| Published By | Publication Date | Number of Pages |
| IEEE | 2008 |
New IEEE Standard – Superseded. An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std 1671.5™-2008 Front cover |
| 3 | Title page |
| 7 | Notice to users Laws and regulations Copyrights Updating of IEEE documents Errata Interpretations |
| 8 | Patents Participants |
| 10 | Contents |
| 11 | Important notice 1. Overview |
| 12 | 1.1 Scope 1.2 Purpose 1.3 Application 1.4 Conventions used within this document |
| 14 | 2. Normative references 3. Definitions, acronyms, and abbreviations 3.1 Definitions |
| 15 | 3.2 Acronyms and abbreviations 4. Schema—TestAdapterDescription.xsd 4.1 General |
| 16 | 4.2 Elements |
| 17 | 4.3 Child elements 4.4 Complex types 4.5 Inherited simple types 4.6 Inherited complex types |
| 18 | 4.7 Inherited attribute groups 5. Schema—TestAdapterInstance.xsd 5.1 General 5.2 Elements |
| 19 | 5.3 Child elements 5.4 Complex types 5.5 Inherited simple types 5.6 Inherited complex types |
| 20 | 5.7 Inherited attribute groups 6. Conformance 7. Extensibility |
| 22 | Annex A (informative) TestAdapterDescription and TestAdapterInstance instance documents(.XML files) |
| 24 | Annex B (informative) Users information and examples |
| 26 | Annex C (informative) Glossary |
| 27 | Annex D (informative) Bibliography |
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