IEEE 1671.3 2008
$44.96
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Unit Under Test(UUT) Description Information
Published By | Publication Date | Number of Pages |
IEEE | 2008 | 33 |
New IEEE Standard – Active. This document contains downloadable .xsd files from http://standards.ieee.org/downloads/1671/. This document specifies an exchange format, utilizing XML, for identifying all of the hardware, software and documentation associated with a unit under test (UUT). This UUT may be tested and diagnosed using a test program set (TPS) on an automatic test system (ATS)
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | IEEE Std 1671.3-2007 Front Cover |
3 | Title Page |
6 | Introduction Notice to users Laws and regulations |
7 | Copyrights Updating of IEEE documents Errata Interpretations Patents |
8 | Participants |
10 | Contents |
11 | Important Notice 1. Overview |
12 | 1.1 Scope 1.2 Purpose 1.3 Application 1.4 Conventions used within this document |
14 | 2. Normative references 3. Definitions, acronyms, and abbreviations 3.1 Definitions |
15 | 3.2 Acronyms and abbreviations 4. Schema—UUTDescription.xsd 4.1 General |
16 | 4.2 Elements |
17 | 4.3 Child elements |
21 | 4.4 Complex types 4.5 Inherited simple types 4.6 Inherited complex types 4.7 Inherited attribute groups |
22 | 5. Schema—UUTInstance.xsd 5.1 General 5.2 Elements |
23 | 5.3 Child elements 5.4 Complex types 5.5 Inherited simple types 5.6 Inherited complex types 5.7 Inherited attribute groups 6. Conformance |
24 | 7. Extensibility |
25 | Annex A (informative) UUTDescription and UUTInstance instance documents (.XML files) |
28 | Annex B (informative) User information and examples |
30 | Annex C (informative) Glossary |
31 | Annex D (informative) Bibliography |