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IEEE 1671.3 2008

$44.96

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Unit Under Test(UUT) Description Information

Published By Publication Date Number of Pages
IEEE 2008 33
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New IEEE Standard – Active. This document contains downloadable .xsd files from http://standards.ieee.org/downloads/1671/. This document specifies an exchange format, utilizing XML, for identifying all of the hardware, software and documentation associated with a unit under test (UUT). This UUT may be tested and diagnosed using a test program set (TPS) on an automatic test system (ATS)

PDF Catalog

PDF Pages PDF Title
1 IEEE Std 1671.3-2007 Front Cover
3 Title Page
6 Introduction
Notice to users
Laws and regulations
7 Copyrights
Updating of IEEE documents
Errata
Interpretations
Patents
8 Participants
10 Contents
11 Important Notice
1. Overview
12 1.1 Scope
1.2 Purpose
1.3 Application
1.4 Conventions used within this document
14 2. Normative references
3. Definitions, acronyms, and abbreviations
3.1 Definitions
15 3.2 Acronyms and abbreviations
4. Schema—UUTDescription.xsd
4.1 General
16 4.2 Elements
17 4.3 Child elements
21 4.4 Complex types
4.5 Inherited simple types
4.6 Inherited complex types
4.7 Inherited attribute groups
22 5. Schema—UUTInstance.xsd
5.1 General
5.2 Elements
23 5.3 Child elements
5.4 Complex types
5.5 Inherited simple types
5.6 Inherited complex types
5.7 Inherited attribute groups
6. Conformance
24 7. Extensibility
25 Annex A (informative) UUTDescription and UUTInstance instance documents (.XML files)
28 Annex B (informative) User information and examples
30 Annex C (informative) Glossary
31 Annex D (informative) Bibliography
IEEE 1671.3 2008
$44.96