IEC 60747-14-11:2021
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Semiconductor devices – Part 14-11: Semiconductor sensors – Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
Published By | Publication Date | Number of Pages |
IEC | 2021-03-03 | 26 |
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IEC 60747-14-11:2021(E) defines the terms, definitions, configuration, and test methods can be used to evaluate and determine the performance characteristics of surface acoustic wave-based semiconductor sensors integrated with ultraviolet, illuminance, and temperature sensors. The measurement methods are for DC characteristics and RF characteristics, and the measurement method for RF characteristics includes a direct mode and differential amplifier mode based on feedback oscillation. This document excludes devices dealt with by TC 49: piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection.
Published Code | IEC |
---|---|
Published By | International Electrotechnical Commission |
Publication Date | 2021-03-03 |
Pages Count | 26 |
Language | English |
Edition | 1.0 |
File Size | 2.2 MB |
ICS Codes | 31.080.01 - Semiconductor devices in general |
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