BSI PD 6598:1996
$142.49
Measurement techniques for the characterization of the European mini test chip
| Published By | Publication Date | Number of Pages |
| BSI | 1996 | 28 |
| Status | Withdrawn |
|---|---|
| Pages | 28 |
| Publication Date | 1996-07-15 |
| Withdrawn Date | 2004-05-01 |
| ISBN | 0 580 25804 1 |
| Standard Number | PD 6598:1996, CENELEC Report R117-005:1995 |
| Title | Measurement techniques for the characterization of the European mini test chip |
| Identical National Standard Of | CENELEC Report R117-005:1995 |
| Descriptors | Metal oxide semiconductors, Digital integrated circuits, Dimensional measurement, Frequency measurement, Transistors, Capacitance measurement, Thickness measurement, Current measurement, Electrical measurement, Microprocessor chips, Capacitors |
| Publisher | BSI |
| Committee | EPL/501 |
| ICS Codes | 31.200 - Integrated circuits. Microelectronics |
