BSI 22/30400660 DC 2022
$24.66
BS ISO/IEC 23837-2. Information technology security techniques. Security requirements, test and evaluation methods for quantum key distribution – Part 2. Evaluation and testing methods
Published By | Publication Date | Number of Pages |
BSI | 2022 | 110 |
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | 30400660-NC.pdf |
3 | ISO_IEC DIS 23837-2 ed.1 – id.77309 Enquiry PDF (en).pdf |
8 | Foreword |
9 | Introduction |
11 | 1 Scope 2 Normative references 3 Terms and definitions |
13 | 4 Abbreviated terms |
14 | 5 Overview of the evaluation method for QKD modules 5.1 General 5.2 Scope of the evaluation method |
15 | 5.3 Overview of evaluation activities for SFRs 5.3.1 General |
16 | 5.3.2 Evaluation activities for SFRs FTP_QKD.1 and FTP_QKD.2 5.3.3 Evaluation activities for SFRs on quantum optical components and parameter adjustment procedure(s) |
17 | 5.3.4 Evaluation activities for SFRs on conventional network components 5.3.5 Thresholds and input parameters related to the evaluation activities 5.4 Overview of evaluation activities for SARs |
18 | 6 Supplementary activities for the evaluation of FTP_QKD 6.1 General |
19 | 6.2 Evaluation activity to test quantum state transmission and sifting procedures 6.2.1 General aspects |
21 | 6.2.2 Test procedure |
23 | 6.2.3 Pass/fail criteria |
24 | 6.3 Evaluation activity to test other post-processing procedures 6.3.1 General aspects |
25 | 6.3.2 Test procedure |
26 | 6.3.3 Pass/fail criteria 6.4 Evaluation activity to test parameter adjustment procedure(s) 6.4.1 General aspects |
28 | 6.4.2 Test procedure 6.4.3 Pass/fail criteria 7 Supplementary activities for the evaluation of quantum optical components in the transmitter module 7.1 General |
31 | 7.2 Evaluation activity to test the photon-number distribution of optical pulses 7.2.1 General aspects |
33 | 7.2.2 Test procedure 7.2.3 Pass/fail criteria |
34 | 7.3 Evaluation activity to test the mean photon number and stability of optical pulses 7.3.1 General aspects |
35 | 7.3.2 Test procedure |
36 | 7.3.3 Pass/fail criteria 7.4 Evaluation activity to test the independence of the intensities of optical pulses 7.4.1 General aspects |
37 | 7.4.2 Test procedure |
38 | 7.4.3 Pass/fail criteria |
39 | 7.5 Evaluation activity to test the accuracy of state encoding 7.5.1 General aspects 7.5.2 Test procedure |
40 | 7.5.3 Pass/fail criteria 7.6 Evaluation activity to test the indistinguishability of encoded states from the perspective of non-encoding degrees of freedom 7.6.1 General aspects |
42 | 7.6.2 Test procedure |
43 | 7.6.3 Pass/fail criteria |
44 | 7.7 Evaluation activity to test the uniform distribution of the global phase of optical pulses 7.7.1 General aspects |
45 | 7.7.2 Test procedure |
46 | 7.7.3 Pass/fail criteria 7.8 Evaluation activity to test the degree of optical isolation of the TX module 7.8.1 General aspects |
47 | 7.8.2 Test procedure |
48 | 7.8.3 Pass/fail criteria 7.9 Evaluation activity to test the sensitivity of the injected light monitor in the TX module 7.9.1 General aspects |
49 | 7.9.2 Test procedure |
50 | 7.9.3 Pass/fail criteria 7.10 Evaluation activity to test the robustness of the TX module against laser injection 7.10.1 General aspects |
52 | 7.10.2 Test procedure |
54 | 7.10.3 Pass/fail criteria 8 Supplementary activities for the evaluation of quantum optical components in the receiver module 8.1 General |
56 | 8.2 Evaluation activity to test the consistency of detection probability in the RX module 8.2.1 General aspects |
58 | 8.2.2 Test procedure 8.2.3 Pass/fail criteria 8.3 Evaluation activity to test if back-flashes from the RX module can leak information 8.3.1 General aspects |
60 | 8.3.2 Test procedure 8.3.3 Pass/fail criteria 8.4 Evaluation activity to test the degree of optical isolation of the RX module 8.4.1 General aspects |
61 | 8.4.2 Test procedure |
62 | 8.4.3 Pass/fail criteria 8.5 Evaluation activity to test the sensitivity of the injected light monitor in the RX module 8.5.1 General aspects |
63 | 8.5.2 Test procedure |
64 | 8.5.3 Pass/fail criteria 8.6 Evaluation activity to test the robustness of the RX module against bright light blinding 8.6.1 General aspects |
65 | 8.6.2 Test procedure |
66 | 8.6.3 Pass/fail criteria 8.7 Evaluation activity to test the appropriateness of dead time settings of single-photon detectors 8.7.1 General aspect |
67 | 8.7.2 Test procedure 8.7.3 Pass/fail criteria |
68 | 8.8 Evaluation activity to test the temporal profile of the detection efficiency for single-photon detectors 8.8.1 General aspects 8.8.2 Test procedure |
69 | 8.8.3 Pass/fail criteria 8.9 Evaluation activity to test the robustness of the RX module against laser injection 8.9.1 General aspects |
70 | 8.9.2 Test procedure |
71 | 8.9.3 Pass/fail criteria |
72 | 8.10 Evaluation activity to test the detection limits of homodyne detectors in the RX module 8.10.1 General aspects |
73 | 8.10.2 Test procedure 8.10.3 Pass/fail criteria 8.11 Evaluation activity to test the appropriateness of double-click events handling 8.11.1 General aspects |
74 | 8.11.2 Test procedure 8.11.3 Pass/fail criteria 9 Supplementary activities for the evaluation of parameter adjustment procedures 9.1 General |
75 | 9.2 Evaluation activity to test if detection probability mismatch can be induced by tampering with the temporal alignment procedure(s) 9.2.1 General aspects |
77 | 9.2.2 Test procedure |
79 | 9.2.3 Pass/fail criteria 9.3 Evaluation activity to test if the shot noise is properly aligned 9.3.1 General aspects |
80 | 9.3.2 Test procedure |
81 | 9.3.3 pass/fail criteria 10 Supplementary activities for the evaluation of SFRs on conventional network components 10.1 General |
82 | 10.2 Evaluation activities for FCS related SFRs overview 10.3 Evaluation activities for other SFRs overview 11 Supplementary activities for SARs 11.1 General 11.2 Supplementary activities for Class APE: Protection Profile evaluation |
84 | 11.3 Supplementary activities for Class ASE: Security Target evaluation 11.4 Supplementary activities for Class ADV: Development 11.4.1 Supplementary activities for ADV_ARC |
85 | 11.4.2 Supplementary activities for ADV_FSP |
86 | 11.5 Supplementary activities for Class AGD: Guidance documents 11.5.1 Supplementary activities for AGD_OPE |
87 | 11.5.2 Supplementary activities for AGD_PRE 11.6 Supplementary activities for Class ATE: Test 11.6.1 Supplementary activities for ATE_FUN |
88 | 11.6.2 Supplementary activities for ATE_IND |
89 | 11.7 Supplementary activities for Class AVA: Vulnerability assessment |
92 | 12 Conformance statement 12.1 General 12.2 Conformance statement specific to evaluation activities for SFRs 12.3 Conformance statement specific to evaluation activities for SARs |
94 | Annex€A (informative) Calculation of attack potential for the evaluation of QKD modules |
101 | Annex€B (informative) Rating examples for AVA attack potential computation |
104 | Annex€C (informative) Thresholds collection |
108 | Annex€D (informative) Correspondence between EAs and known attacks to quantum optical components and parameter adjustment procedure(s) of QKD modules |
110 | Bibliography |