BS ISO/IEC 10373-1:2020+A1:2023
$215.11
Cards and security devices for personal identification. Test methods – General characteristics
Published By | Publication Date | Number of Pages |
BSI | 2023 | 74 |
PDF Catalog
PDF Pages | PDF Title |
---|---|
2 | undefined |
8 | Foreword |
9 | Introduction |
11 | 1 Scope 2 Normative references 3 Terms, definitions and abbreviated terms 3.1 Terms and definitions |
13 | 3.2 Abbreviated terms 4 Default items applicable to the test methods 4.1 Test environment 4.2 Pre-conditioning 4.3 Selection of test methods |
14 | 4.4 Default tolerance 4.5 Total measurement uncertainty 5 Test methods 5.1 Card warpage 5.1.1 General 5.1.2 Apparatus 5.1.3 Procedure |
15 | 5.1.4 Test report 5.2 Dimensions of cards 5.2.1 General 5.2.2 Thickness of card measurements |
16 | 5.2.3 Height and width of card measurement 5.3 Peel strength 5.3.1 General |
17 | 5.3.2 Apparatus 5.3.3 Procedure |
19 | 5.3.4 Test report 5.4 Peel strength including the edge of the card 5.4.1 General 5.4.2 Apparatus |
21 | 5.4.3 Procedure |
24 | 5.4.4 Test report 5.5 Resistance to chemicals 5.5.1 General 5.5.2 Reagents |
27 | 5.5.3 Procedure |
28 | 5.5.4 Test report 5.6 Card dimensional stability and warpage with temperature and humidity 5.6.1 General 5.6.2 Procedure 5.6.3 Test report |
29 | 5.7 Adhesion or blocking 5.7.1 General 5.7.2 Procedure 5.7.3 Test report 5.8 Bending stiffness 5.8.1 General 5.8.2 Procedure |
31 | 5.8.3 Test report 5.9 Dynamic bending stress 5.9.1 General 5.9.2 Apparatus |
33 | 5.9.3 Calibration method 5.9.4 Procedure |
34 | 5.9.5 Test report |
35 | 5.10 Dynamic torsional stress 5.10.1 General 5.10.2 Apparatus 5.10.3 Procedure |
36 | 5.10.4 Test report 5.11 Opacity 5.11.1 General 5.11.2 Apparatus |
38 | 5.11.3 Procedure |
39 | 5.12 X-rays 5.12.1 General 5.12.2 Procedure 5.12.3 Test report 5.13 Embossing relief height of characters 5.13.1 General 5.13.2 Apparatus 5.13.3 Procedure 5.13.4 Test report 5.14 Resistance to heat 5.14.1 General |
40 | 5.14.2 Apparatus 5.14.3 Procedure |
41 | 5.14.4 Test report 5.15 Surface distortions, raised areas and depressed areas 6 Test methods for ICCs 6.1 Conventions for electrical measurements on ICCs with contacts 6.2 Apparatus for measurements on ICCs with contacts 6.2.1 Default ICC holder, reference axes and default measurement position |
42 | 6.2.2 Default ICC holder and reference axes 6.2.3 Flattening plate 6.2.4 Default Measurement Position |
43 | 6.3 Dimension and location of contacts for ICCs with contacts 6.3.1 General 6.3.2 Apparatus 6.3.3 Procedure |
44 | 6.3.4 Test report 6.4 Mechanical strength of contacts 6.4.1 General 6.4.2 Apparatus |
46 | 6.4.3 Procedure 6.4.4 Test report 6.5 ESD — Electrostatic discharge for ICC contact cards 6.5.1 General 6.5.2 Test report 6.6 ESS — Electrostatic stress for PICC and VICC 6.6.1 General |
47 | 6.6.2 Apparatus 6.6.3 Test procedure |
48 | 6.6.4 Test report 6.7 Electrical resistance of contacts of ICCs with contacts 6.7.1 General 6.7.2 Apparatus |
49 | 6.7.3 Procedure 6.7.4 Test report |
50 | 6.8 Additional test methods regarding electrostatic effects 6.9 Surface profile of contacts of ICCs with contacts 6.9.1 General 6.9.2 Apparatus 6.9.3 Procedure |
51 | 6.9.4 Test report 6.10 ICC — Mechanical strength: 3 wheel test for ICCs with contacts 6.10.1 General 6.10.2 Apparatus |
55 | 6.10.3 Procedure |
56 | 6.10.4 Test report |
57 | Annex A (informative) Electrostatic discharge conductivity of cards |
67 | Annex B (informative) ESD sensitivity of cards to CDM |
71 | Bibliography |