BS ISO 26824:2013
$198.66
Particle characterization of particulate systems. Vocabulary
| Published By | Publication Date | Number of Pages |
| BSI | 2013 | 62 |
This International Standard establishes a vocabulary of terms and definitions relevant to the particle characterization of particulate systems. It covers such fields as the representation of results of particle size analysis, the descriptive and quantitative representation of particle shape and morphology, sample preparation, specific surface area and porosity characterization and measurement methods including sedimentation, classification, acoustic methods, laser diffraction, dynamic light scattering, single particle light interaction methods, differential electrical mobility analysis and image analysis, in a size scale from nanometre to millimetre.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | Foreword |
| 7 | Introduction |
| 9 | Section sec_1 Section sec_1.1 Section sec_1.2 Section sec_1.3 Scope 1 General terms, representation of particle size and classification analysis |
| 10 | Section sec_1.4 Section sec_1.5 Section sec_1.6 Section sec_1.7 |
| 11 | Section sec_1.8 Section sec_1.9 |
| 12 | Section sec_1.10 Section sec_1.11 Section sec_1.12 Section sec_1.13 |
| 13 | Section sec_1.14 Section sec_1.15 Section sec_2 Section sec_2.1 Section sec_2.2 Section sec_2.3 Section sec_2.4 Section sec_2.5 2 Sedimentation analysis |
| 14 | Section sec_2.6 Section sec_2.7 Section sec_3 Section sec_3.1 Section sec_3.2 Section sec_3.3 Section sec_3.4 Section sec_3.5 Section sec_3.6 Section sec_3.7 3 Pore size distribution, porosity and surface area analysis |
| 15 | Section sec_3.8 Section sec_3.9 Section sec_3.10 Section sec_3.11 Section sec_3.12 Section sec_3.13 Section sec_3.14 Section sec_3.15 Section sec_3.16 Section sec_3.17 |
| 16 | Section sec_3.18 Section sec_3.19 Section sec_3.20 Section sec_3.21 Section sec_3.22 Section sec_3.23 Section sec_3.24 Section sec_3.25 Section sec_3.26 Section sec_3.27 |
| 17 | Section sec_3.28 Section sec_3.29 Section sec_3.30 Section sec_3.31 Section sec_3.32 Section sec_3.33 Section sec_3.34 Section sec_3.35 Section sec_3.36 Section sec_3.37 |
| 18 | Section sec_3.38 Section sec_3.39 Section sec_3.40 Section sec_3.41 Section sec_3.42 Section sec_3.43 Section sec_3.44 Section sec_3.45 Section sec_3.46 |
| 19 | Section sec_3.47 Section sec_4 Section sec_4.1 Section sec_4.2 Section sec_4.3 Section sec_4.4 Section sec_4.5 4 Representation of particle shape analysis |
| 20 | Section sec_4.6 Section sec_4.7 Section sec_4.8 Section sec_4.9 Section sec_4.10 Section sec_4.11 |
| 21 | Section sec_4.12 Section sec_4.13 Section sec_5 Section sec_5.1 Section sec_5.2 Section sec_5.3 Section sec_5.4 5 Electrical sensing methods |
| 22 | Section sec_5.5 Section sec_5.6 Section sec_5.7 Section sec_6 Section sec_6.1 Section sec_6.2 Section sec_6.3 6 Laser diffraction methods |
| 23 | Section sec_6.4 Section sec_6.5 Section sec_6.6 Section sec_6.7 Section sec_6.8 Section sec_6.9 |
| 24 | Section sec_6.10 Section sec_6.11 Section sec_6.12 Section sec_6.13 Section sec_6.14 Section sec_6.15 |
| 25 | Section sec_6.16 Section sec_6.17 Section sec_6.18 Section sec_6.19 Section sec_6.20 Section sec_6.21 Section sec_6.22 Section sec_7 Section sec_7.1 7 Dynamic light scattering |
| 26 | Section sec_7.2 Section sec_7.3 Section sec_7.4 Section sec_7.5 Section sec_7.6 Section sec_8 Section sec_8.1 Section sec_8.2 8 Image analysis methods |
| 27 | Section sec_8.3 Section sec_8.4 Section sec_8.5 Section sec_8.6 Section sec_8.7 Section sec_8.8 Section sec_8.9 |
| 28 | Section sec_8.10 Section sec_8.11 Section sec_8.12 Section sec_8.13 Section sec_8.14 Section sec_8.15 Section sec_8.16 Section sec_8.17 Section sec_8.18 Section sec_8.19 |
| 29 | Section sec_8.20 Section sec_8.21 Section sec_8.22 Section sec_9 Section sec_9.1 Section sec_9.2 Section sec_9.3 Section sec_9.4 Section sec_9.5 9 Single particle light interaction methods |
| 30 | Section sec_9.6 Section sec_9.7 Section sec_9.8 Section sec_9.9 Section sec_9.10 Section sec_9.11 Section sec_10 Section sec_10.1 10 Small angle X-Ray scattering method |
| 31 | Section sec_10.2 Section sec_11 Section sec_11.1 Section sec_11.2 Section sec_11.3 Section sec_11.4 Section sec_11.5 Section sec_11.6 Section sec_11.7 11 Sample preparation and reference materials |
| 32 | Section sec_11.8 Section sec_11.9 Section sec_11.10 Section sec_11.11 Section sec_11.12 Section sec_11.13 Section sec_11.14 Section sec_11.15 Section sec_12 Section sec_12.1 12 Electrical mobility and number concentration analysis for aerosol particles |
| 33 | Section sec_12.2 Section sec_12.3 Section sec_12.4 Section sec_12.5 Section sec_12.6 Section sec_12.7 |
| 34 | Section sec_12.8 Section sec_12.9 Section sec_12.10 Section sec_12.11 Section sec_12.12 Section sec_12.13 Section sec_12.14 Section sec_12.15 |
| 35 | Section sec_12.16 Section sec_12.17 Section sec_12.18 Section sec_13 Section sec_13.1 Section sec_13.2 Section sec_13.3 Section sec_13.4 13 Electrical charge conditioning |
| 36 | Section sec_13.5 Section sec_13.6 Section sec_14 Section sec_14.1 Section sec_14.2 Section sec_14.3 Section sec_14.4 Section sec_14.5 14 Acoustic methods |
| 37 | Section sec_14.6 Section sec_14.7 Section sec_14.8 Section sec_14.9 Section sec_14.10 Section sec_14.11 Section sec_14.12 Section sec_14.13 Section sec_14.14 |
| 38 | Section sec_14.15 Section sec_14.16 Section sec_14.17 Section sec_14.18 Section sec_14.19 Section sec_14.20 Section sec_14.21 Section sec_14.22 Section sec_14.23 |
| 39 | Section sec_14.24 Section sec_14.25 Section sec_15 Section sec_15.1 Section sec_16 Section sec_16.1 Section sec_16.2 Section sec_16.3 Section sec_16.4 15 Focused beam methods 16 Characterization of particle dispersion in liquids |
| 40 | Section sec_16.5 Section sec_16.6 Section sec_16.7 Section sec_16.8 Section sec_16.9 Section sec_16.10 Section sec_16.11 Section sec_16.12 |
| 41 | Section sec_17 Section sec_17.1 Section sec_17.1.1 Section sec_17.1.2 Section sec_17.1.3 Section sec_17.1.4 Section sec_17.1.5 Section sec_17.1.6 17 Methods for zeta potential determination |
| 42 | Section sec_17.1.7 Section sec_17.1.8 Section sec_17.1.9 Section sec_17.1.10 Section sec_17.1.11 Section sec_17.1.12 Section sec_17.1.13 Section sec_17.1.14 |
| 43 | Section sec_17.1.15 Section sec_17.1.16 Section sec_17.1.17 Section sec_17.1.18 Section sec_17.2 Section sec_17.2.1 Section sec_17.2.2 17.2 Electrokinetic phenomena |
| 44 | Section sec_17.2.3 Section sec_17.2.4 Section sec_17.2.5 Section sec_17.2.6 Section sec_17.2.7 Section sec_17.3 17.3 Electroacoustic phenomena |
| 45 | Section sec_17.3.1 Section sec_17.3.2 Section sec_17.3.3 Section sec_17.3.4 Section sec_17.3.5 Section sec_17.3.6 |
| 46 | Section sec_17.3.7 Section sec_17.3.8 |
| 47 | Annex sec_A Annex A (informative) Alphabetical index |
| 57 | Reference ref_1 Reference ref_2 Reference ref_3 Reference ref_4 Reference ref_5 Reference ref_6 Reference ref_7 Reference ref_8 Reference ref_9 Reference ref_10 Reference ref_11 Reference ref_12 Reference ref_13 Reference ref_14 Reference ref_15 Reference ref_16 Reference ref_17 Reference ref_18 Reference ref_19 Reference ref_20 Reference ref_21 Reference ref_22 Bibliography |
| 58 | Reference ref_23 Reference ref_24 Reference ref_25 Reference ref_26 Reference ref_27 Reference ref_28 Reference ref_29 Reference ref_30 Reference ref_31 Reference ref_32 |
