BS ISO 25498:2018 – TC:2020 Edition
$246.62
Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
| Published By | Publication Date | Number of Pages |
| BSI | 2020 | 116 |
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 70 | undefined |
| 74 | Foreword |
| 76 | Introduction |
| 77 | 1 Scope 2 Normative references 3 Terms and definitions |
| 79 | 4 Principle 4.1 General 4.2 Spot diffraction pattern |
| 82 | 4.3 Kikuchi pattern |
| 83 | 4.4 Polycrystalline specimen 5 Reference materials |
| 84 | 6 Equipment 7 Specimens 8 Experimental procedure 8.1 Instrument preparation |
| 85 | 8.2 Procedure for acquirement of selected area electron diffraction patterns |
| 88 | 8.3 Determination of diffraction constant, Lλ |
| 89 | 9 Measurement and solution of the SAED patterns 9.1 Selection of the basic parallelogram |
| 91 | 9.2 Indexing diffraction spots |
| 92 | 10 180° ambiguity 11 Uncertainty estimation 11.1 Factors affecting accuracy |
| 93 | 11.2 Calibration with a reference material |
| 94 | Annex A (informative) Interplanar spacing |
| 95 | Annex B (informative) Spot diffraction patterns of single crystals for BCC, FCC and HCP structure[7] |
| 114 | Bibliography |
