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BS ISO 14701:2011

BS ISO 14701:2011

$142.49

Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness

Published By Publication Date Number of Pages
BSI 2011 24
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Status

Withdrawn
Title

Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Publisher

BSI
Committee

CII/60
Pages

24
Publication Date

2011-08-31
Withdrawn Date

2018-11-05
Replaced By

BS ISO 14701:2018
ISBN

978 0 580 69624 4
Standard Number

BS ISO 14701:2011
Identical National Standard Of

ISO 14701:2011
Descriptors

Silicon, Surface chemistry, Surface properties, X-ray photoelectron spectroscopy, Chemical analysis and testing, Thickness measurement, Electron emission, Photoelectron spectroscopy, Oxides, Spectroscopy
ICS Codes 71.040.40 - Chemical analysis
BS ISO 14701:2011
$142.49