BS EN IEC 61788-7:2020
$189.07
Superconductivity – Electronic characteristic measurements. Surface resistance of high-temperature superconductors at microwave frequencies
| Published By | Publication Date | Number of Pages |
| BSI | 2020 | 50 |
IEC 61788-7:2020 is available as IEC 61788-7:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61788-7:2020 describes measurement of the surface resistance (Rs) of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of Rs for this method is as follows: – Frequency: 8 GHz < f < 30 GHz – Measurement resolution: 0,01 m ? at 10 GHz The Rs data at the measured frequency, and that scaled to 10 GHz, assuming the f 2 rule for comparison, is reported. This third edition cancels and replaces the second edition, published in 2006. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) informative Annex B, relative combined standard uncertainty for surface resistance measurement has been added; b) precision and accuracy statements have been converted to uncertainty; c) reproducibility in surface resistant measurement has been added.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 5 | Annex ZA(normative)Normative references to international publicationswith their corresponding European publications |
| 7 | English CONTENTS |
| 10 | FOREWORD |
| 12 | INTRODUCTION |
| 13 | 1 Scope 2 Normative references 3 Terms and definitions 4 Requirements |
| 14 | 5 Apparatus 5.1 Measurement system Figure 1 – Schematic diagram of measurement system for temperature dependence of Rs using a cryocooler |
| 15 | 5.2 Measurement apparatus for Rs Figures |
| 16 | Figure 2 – Typical measurement apparatus for Rs |
| 17 | 5.3 Dielectric rods 6 Measurement procedure 6.1 Specimen preparation Table 1 – Typical dimensions of pairs of single-crystal sapphire rods for 12 GHz, 18 GHz and 22 GHz |
| 18 | 6.2 Set-up 6.3 Measurement of reference level Tables Table 2 – Dimensions of superconductor film for 12 GHz, 18 GHz, and 22 GHz |
| 19 | 6.4 Measurement of the frequency response of resonators Figure 3 – Insertion attenuation, IA, resonant frequency, f0, and half power bandwidth, Δf, measured at T kelvin |
| 21 | 6.5 Determination of surface resistance of the superconductor and ε′ and tan δ of the standard sapphire rods Figure 4 – Reflection scattering parameters (S11 and S22) |
| 22 | 7 Uncertainty of the test method 7.1 Surface resistance Table 3 – Specifications for vector network analyzer Table 4 – Specifications for sapphire rods |
| 23 | 7.2 Temperature 7.3 Specimen and holder support structure Figure 5 – Term definitions in Table 4 |
| 24 | 7.4 Specimen protection 7.5 Uncertainty of surface resistance measured by standard two-resonator method 8 Test report 8.1 Identification of test specimen 8.2 Report of Rs values 8.3 Report of test conditions |
| 25 | Annex A (informative) Additional information relating to Clauses 1 to 8 A.1 Scope A.1.1 General A.1.2 Cylindrical cavity method [10] [17] A.1.3 Parallel-plates resonator method [18] [19] A.1.4 Microstrip-line resonance method [20] [21] A.1.5 Dielectric resonator method [22] [23] [24] [25] |
| 26 | A.1.6 Image-type dielectric resonator method [26] [27] Figure A.1 – Schematic configuration of several measurement methods for the surface resistance |
| 27 | A.1.7 Two-resonator method [28] [29] A.2 Requirements A.3 Theory and calculation equations |
| 28 | Figure A.2 – Configuration of a cylindrical dielectric rod resonator short-circuited at both ends by two parallel superconductor films deposited on dielectric substrates |
| 29 | Figure A.3 – Computed results of the u-v and W-v relations for TE01p mode |
| 30 | A.4 Apparatus Figure A.4 – Configuration of standard dielectric rods for measurement of Rs and tan δ |
| 31 | A.5 Dimensions of the standard sapphire rods Figure A.5 – Three types of dielectric resonators |
| 32 | Figure A.6 – Mode chart to design TE011 resonator short-circuited at both ends by parallel superconductor films [28] |
| 33 | A.6 Dimension of the closed type resonator Figure A.7 – Mode chart to design TE013 resonator short-circuited at both ends by parallel superconductor films [28] |
| 34 | Figure A.8 – Mode chart for TE011 closed-type resonator [28] |
| 35 | A.7 Sapphire rod reproducibility A.8 Test results Figure A.9 – Mode chart for TE013 closed-type resonator [28] |
| 36 | A.9 Reproducibility of measurement method Figure A.10 – Temperature-dependent Rs of YBCO film with a thickness of 500 nm and size of 25 mm square |
| 37 | A.10 tan δ deviation effect of sapphire rods on surface resistance Figure A.11 – Temperature dependent Rs of YBCO film when Rs was measured three times Table A.1 – Standard deviation of the surface resistance calculated from the results of Figure A.11 |
| 38 | Table A.2 – Relationship between x, defined by Equation (A.12), and y, defined by Equation (A.13) |
| 39 | Annex B (informative) Evaluation of relative combined standard uncertainty for surface resistance measurement B.1 Practical surface resistance measurement Figure B.1 – Schematic diagram of TE011 and TE013 mode resonance |
| 40 | B.2 Determination of surface resistance of the superconductor Figure B.2 – Typical frequency characteristics of TE011 mode resonance |
| 41 | B.3 Combined standard uncertainty B.3.1 General B.3.2 Calculation of c2 to c5 (12 GHz resonance at 20 K) |
| 42 | B.3.3 Determination of u1 to u5 |
| 44 | B.3.4 Combined relative standard uncertainty Figure B.3 – Frequency characteristics of a resonator approximated by a Lorentz distribution |
| 46 | Bibliography |
