BS EN 16602-70-10:2015
$215.11
Space product assurance. Qualification of printed circuit boards
Published By | Publication Date | Number of Pages |
BSI | 2015 | 94 |
This Standard defines the requirements for evaluation, qualification and maintenance of qualification of PCB manufacturers for different types of PCBs. This Standard is applicable to the following type of PCBs: – Rigid PCBs (single-sided, double-sided, multilayer, sequential-laminated multilayer, metal core) – Flexible PCB (single-sided and double-sided) – Rigid-flex PCBs (multilayer and sequential-laminated multilayer) – High frequency PCBs – Special PCBs. PCBs are used for the mounting of components in order to produce PCB assemblies performing complex electrical functions. The PCBs are subjected to thermal and mechanical shocks during their assembly such as mounting of components by soldering, rework and repair under normal terrestrial conditions, and in addition the complex PCB assembly are subjected to the environment imposed by launch and space flights. This standard may be tailored for the specific characteristics and constraints of a space project in conformance with ECSS-S-ST-00.
PDF Catalog
PDF Pages | PDF Title |
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13 | 3.1 Terms from other standards 3.2 Terms specific to the present standard |
16 | 3.3 Abbreviated terms |
18 | 4.1 General 4.2 Roles |
19 | 4.3 Specification of test requirements |
20 | 5.1 General 5.2 Request for evaluation 5.3 Evaluation PCBs |
21 | 5.4 Line audit |
22 | 6.1 General 6.2 Qualification programme definition and approval |
23 | 6.3 Nonconformance criteria 6.4 Qualification programme implementation |
27 | 6.5 Qualification PCBs 6.5.1 General |
29 | 6.5.2 Test pattern A: Electrical test 6.5.3 Test pattern B: Mechanical test |
30 | 6.5.4 Test pattern C: Electrical test 6.5.5 Test pattern D: Electrical test and visual aspect |
31 | 6.5.6 Test pattern E: Electrical test |
32 | 6.5.7 Test pattern F: Metal�plating test 6.5.8 Test pattern G: Metal�plating/coating test |
33 | 6.5.9 Test pattern H: Electrical test 6.5.10 Test pattern J: Solderability test |
34 | 6.5.11 Test pattern K: Physical test 6.5.12 Test pattern L: Demonstration of technological capability |
35 | 6.5.13 Test pattern M: CAD/CAM criteria(on request by the qualification authority) |
36 | 6.5.14 Test pattern X: Resistance to bending cycles (for flexible parts only) 6.5.15 Test pattern Y: Electrical test(on request by the supplier) |
37 | 6.5.16 Test pattern W: Electrical test for high frequency circuits (on request by the supplier) 6.6 Qualification approval 6.7 Maintenance of qualification |
39 | 7.1 General 7.2 Group 1 — Visual inspection and non�destructive test 7.2.1 General 7.2.2 Verification of marking |
40 | 7.2.3 Visual aspects |
43 | 7.2.4 External dimensions 7.2.5 Warp |
44 | 7.2.6 Twist 7.2.7 Subgroup 1.1 — Specific dimensional check |
46 | 7.2.8 Subgroup 1.2 — Electrical measurements 7.2.8.1 General 7.2.8.2 Intralayer insulation resistance on test pattern A 7.2.8.3 Interlayer insulation resistance on test pattern H 7.2.8.4 Dielectric withstanding voltage intralayer on test pattern A and interlayer on test pattern H |
47 | 7.2.8.5 Continuity on test pattern D 7.2.8.6 Interconnection resistance on test pattern E |
48 | 7.2.8.7 Impedance test on test pattern Y 7.2.8.8 Dielectric constant and loss tangent for high frequency materials on test pattern W 7.3 Group 2 — Miscellaneous tests 7.3.1 General 7.3.2 Subgroup 2.1 — Solderability test — Wettability on test pattern J |
49 | 7.3.3 Subgroup 2.2 — Mechanical tests 7.3.3.1 Peel strength on test pattern B |
50 | 7.3.3.2 Pull�off strength on test pattern B 7.3.3.3 Flexural fatigue on test pattern X (only for double sided flexible PCB) |
51 | 7.3.3.4 Bending test (only for rigid�flex) 7.3.4 Subgroup 2.3 — Coatings tests 7.3.4.1 Coating adhesion of non�fused SnPb finishes on test pattern G |
52 | 7.3.4.2 Analysis of SnPb coating on test pattern G 7.3.4.3 Microsectioning on test pattern F |
58 | 7.3.5 Subgroup 2.4 — Electrical tests 7.3.5.1 Current overload on test pattern E |
59 | 7.3.5.2 Internal short circuit on test pattern C |
60 | 7.3.6 Subgroup 2.5 — Physical tests on test pattern K 7.3.6.1 Water absorption (optional) 7.3.6.2 Outgassing |
61 | 7.4 Group 3 — Thermal stress and thermal shock (on PCB) 7.4.1 General 7.4.2 Solder bath float and vapour phase reflow simulation (on board without test pattern F) 7.4.2.1 Solder bath floating test 7.4.2.2 Vapour phase simulation test |
62 | 7.4.3 Rework simulation (thermal shock, hand soldering) on test pattern F |
63 | 7.5 Group 4 — Thermal cycling (on PCB) |
64 | 7.6 Group 5 — Damp heat — Steam ageing (on PCB) 7.6.1 General 7.6.2 Damp heat (on entire PCB excluding test pattern F) 7.6.3 Steam ageing on test pattern F |
66 | 8.1 General 8.2 Data 8.3 Incoming inspection of raw materials 8.4 Traceability |
67 | 8.5 Calibration 8.6 Workmanship standards 8.7 Inspection 8.8 Operator and inspector training 8.9 Quality test specimen |
68 | 8.10 Microsection 8.11 Final inspection and tests 8.12 Delivery |
69 | 9.1 Rigid single�sided and double�sided PCBs |
71 | 9.2 Rigid single�sided and double�sided PCBs for high frequency application |
74 | 9.3 Flexible PCBs |
76 | 9.4 Rigid�flex PCBs 9.5 Rigid multilayer PCBs |
79 | 9.6 Sequential rigid multilayer PCBs |