| Descriptors |
Marking, Capacitance measurement, Optoelectronic devices, Couplers, Overvoltage tests, Wavelengths, Endurance testing, Optical measurement, Luminous intensity, Semiconductor devices, Radiometry, Light-emitting diodes, Light-emitting devices, Light distribution, Inspection, Surges (electrical), Electrical testing, Qualification approval, Testing conditions, Phototransistors, Quality assurance systems, Voltage measurement, Sampling methods, Electrical measurement, Solderability testing, Approval testing, Liquid crystal devices, Short-circuit current tests, Designations, Resistance measurement, Luminance, Radiant flux density, Circuits, Infrared radiation, Flashover, Assessed quality, Electronic equipment and components, Specification (approval), Bandwidths, Test equipment, Time measurement, Mechanical testing, Environmental testing, Thermal-cycling tests, Photodiodes, Performance testing, Current measurement, Orientation, Leak tests
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