ASTM-F1263

$35.75

F1263-99 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

Published By	Publication Date	Number of Pages
ASTM	N/A	3

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Category: ASTM

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Description

ASTM F1263-99-Reapproved

Historical Standard: Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

ASTM F1263

Scope

1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary though exact knowledge may be replaced by over-conservative estimates of this distribution.

Keywords

confidence; rejection; overtest data; statistical analysis

ICS Code

ICS Number Code 31.020 (Electronic components in general)

DOI: 10.1520/F1263-99

Additional information

Standard Title	F1263-99 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Published Code	ASTM
Publication Date	N/A
Pages Count	3