ASME BPVC V 2015

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ASME BPVC – V -2015 BPVC Section V, Nondestructive Examination

Published By	Publication Date	Number of Pages
ASME	2015	888

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Description

PDF Catalog

PDF Pages	PDF Title
4	Table of Contents
16	List of Sections
17	INTERPRETATIONS CODE CASES
18	Foreword
20	Statement of Policy on the Use of the Certification Mark and Code Authorization in Advertising Statement of Policy on the Use of ASME Marking to Identify Manufactured Items
21	Submittal of Technical Inquiries to the Boiler and Pressure Vessel Standards Committees 1 Introduction 2 Inquiry Format
22	3 Code Revisions or Additions 4 Code Cases 5 Code Interpretations 6 Submittals
23	Personnel
40	ASTM Personnel
41	Summary of Changes
46	List of Changes in Record Number Order
49	Cross-Referencing and Stylistic Changes in the Boiler and Pressure Vessel Code Subparagraph Breakdowns/Nested Lists Hierarchy Footnotes Submittal of Technical Inquiries to the Boiler and Pressure Vessel Standards Committees Cross-References
50	Subsection A Nondestructive Methods of Examination Article 1 General Requirements T-110 Scope T-120 General
51	T-130 Equipment T-150 Procedure
52	T-160 Calibration T-170 Examinations and Inspections T-180 Evaluation T-190 Records/Documentation
53	Mandatory Appendices Mandatory Appendix I Glossary of Terms for Nondestructive Examination I-110 Scope I-120 General Requirements I-121 General Terms
71	Mandatory Appendix II Supplemental Personnel Qualification Requirements for NDE Certification II-110 Scope II-120 General Requirements II-121 Level I and Level II Training and Experience Requirements II-122 Level I and Level II Examinations II-123 Level III Requirements II-124 Training Outlines
72	II-121-1 Initial Training and Experience Requirements for CR and DR Techniques II-121-2 Additional Training and Experience Requirements for PAUT and TOFD Ultrasonic Techniques
73	II-122.1 Minimum CR and DR Examination Questions II-122.2 Minimum Ultrasonic Technique Examination Questions
74	Nonmandatory Appendices Nonmandatory Appendix A Imperfection vs Type of NDE Method A-110 Scope A-110 Imperfection vs Type of NDE Method
76	Article 2 Radiographic Examination T-210 Scope T-220 General Requirements T-221 Procedure Requirements T-222 Surface Preparation T-223 Backscatter Radiation T-224 System of Identification T-225 Monitoring Density Limitations of Radiographs T-226 Extent of Examination T-230 Equipment and Materials T-231 Film
77	T-232 Intensifying Screens T-233 Image Quality Indicator (IQI) Design T-233.1 Hole-Type IQI Designation, Thickness, and Hole Diameters T-233.2 Wire IQI Designation, Wire Diameter, and Wire Identity
78	T-234 Facilities for Viewing of Radiographs T-260 Calibration T-261 Source Size T-262 Densitometer and Step Wedge Comparison Film T-270 Examination T-271 Radiographic Technique
79	T-272 Radiation Energy T-273 Direction of Radiation T-274 Geometric Unsharpness T-275 Location Markers
80	T-275 Location Marker Sketches
81	T-276 IQI Selection T-277 Use of IQIs to Monitor Radiographic Examination T-276 IQI Selection
83	T-280 Evaluation T-281 Quality of Radiographs T-282 Radiographic Density T-283 IQI Sensitivity T-283 Equivalent Hole-Type IQI Sensitivity
84	T-284 Excessive Backscatter T-285 Evaluation by Manufacturer T-290 Documentation T-291 Radiographic Technique Documentation Details T-292 Radiograph Review Form
85	Mandatory Appendix I In-Motion Radiography I-210 Scope I-220 General Requirements I-223 Backscatter Detection Symbol Location I-260 Calibration I-263 Beam Width I-270 Examination I-274 Geometric and In-Motion Unsharpness I-275 Location Markers I-277 Placement and Number of IQIs
86	I-279 Repaired Area I-263 Beam Width Determination
87	Mandatory Appendix II Real-Time Radioscopic Examination II-210 Scope II-220 General Requirements II-221 Procedure Requirements II-230 Equipment and Materials II-231 Radioscopic Examination Record II-235 Calibration Block II-236 Calibrated Line Pair Test Pattern and Step Wedge II-237 Equivalent Performance Level II-260 Calibration II-263 System Performance Measurement II-264 Measurement With a Calibration Block
88	II-270 Examination II-278 System Configuration II-280 Evaluation II-286 Factors Affecting System Performance II-290 Documentation II-291 Radioscopic Technique Information II-292 Evaluation by Manufacturer
89	Mandatory Appendix III Digital Image Acquisition, Display, and Storage for Radiography and Radioscopy III-210 Scope III-220 General Requirements III-221 Procedure Requirements III-222 Original Image Artifacts III-230 Equipment and Materials III-231 Digital Image Examination Record III-234 Viewing Considerations III-236 Calibrated Optical Line Pair Test Pattern and Optical Density Step Wedge III-250 Image Acquisition and Storage III-255 Area of Interest III-258 System Configuration III-260 Calibration III-263 System Performance Measurement III-280 Evaluation III-286 Factors Affecting System Performance
90	III-287 System-Induced Artifacts III-290 Documentation III-291 Digital Imaging Technique Information III-292 Evaluation by Manufacturer
91	Mandatory Appendix IV Interpretation, Evaluation, and Disposition of Radiographic and Radioscopic Examination Test Results Produced by the Digital Image Acquisition and Display Process IV-210 Scope IV-220 General Requirements IV-221 Procedure Requirements IV-222 Original Image Artifacts IV-230 Equipment and Materials IV-231 Digital Image Examination Record IV-234 Viewing Considerations IV-236 Calibrated Optical Line Pair Test Pattern and Optical Density Step Wedge
92	IV-250 Image Acquisition, Storage, and Interpretation IV-255 Area of Interest IV-258 System Configuration IV-260 Calibration IV-263 System Performance Measurement IV-280 Evaluation IV-286 Factors Affecting System Performance IV-287 System-Induced Artifacts IV-290 Documentation IV-291 Digital Imaging Technique Information IV-292 Evaluation by Manufacturer
93	Mandatory Appendix V Glossary of Terms for Radiographic Examination
94	Mandatory Appendix VI Acquisition, Display, Interpretation, and Storage of Digital Images of Radiographic Film for Nuclear Applications VI-210 Scope VI-220 General Requirements VI-221 Supplemental Requirements VI-222 Written Procedure VI-223 Personnel Requirements VI-230 Equipment and Materials VI-231 System Features VI-232 System Spot Size
95	VI-240 System Performance Requirements VI-241 Spatial Resolution VI-242 Contrast Sensitivity VI-243 Dynamic Range VI-244 Spatial Linearity VI-250 Technique VI-251 Spatial Resolution Evaluation VI-252 Contrast Sensitivity Evaluation VI-253 Dynamic Range Evaluation VI-254 Spatial Linearity Evaluation VI-260 Demonstration of System Performance VI-261 Procedure Demonstration VI-262 Processed Targets VI-263 Changes in Essential Variables VI-264 Frequency of Verification
96	VI-265 Changes in System Performance VI-270 Examination VI-271 System Performance Requirements VI-272 Artifacts VI-273 Calibration VI-280 Evaluation VI-281 Process Evaluation VI-282 Interpretation VI-283 Baseline VI-290 Documentation VI-291 Reporting Requirements VI-292 Archiving
97	Mandatory Appendix VI Supplement A VI-A-210 Scope VI-A-220 General VI-A-221 Reference Film VI-A-230 Equipment and Materials VI-A-231 Reference Targets VI-A-232 Spatial Resolution Targets VI-A-233 Constrast Sensitivity Targets VI-A-234 Dynamic Range Targets VI-A-235 Spatial Linearity Targets VI-A-240 Miscellaneous Requirements
98	VI-A-1 Reference Film
99	VI-A-241 Material VI-A-242 Film Size VI-A-243 Spatial Resolution VI-A-244 Density VI-A-245 Linearity
100	Mandatory Appendix VII Radiographic Examination of Metallic Castings VII-210 Scope VII-220 General Requirements VII-224 System of Identification VII-270 Examination VII-271 Radiographic Technique VII-276 IQI Selection VII-280 Evaluation VII-282 Radiographic Density VII-290 Documentation VII-293 Layout Details
101	Mandatory Appendix VIII Radiography Using Phosphor Imaging Plate VIII-210 Scope VIII-220 General Requirements VIII-221 Procedure Requirements VIII-225 Monitoring Density Limitations of Radiographs VIII-230 Equipment and Materials VIII-231 Phosphor Imaging Plate VIII-234 Facilities for Viewing of Radiographs VIII-260 Calibration VIII-262 Densitometer and Step Wedge Comparison Film VIII-270 Examination VIII-277 Use of IQIs to Monitor Radiographic Examination
102	VIII-280 Evaluation VIII-281 System-Induced Artifacts VIII-282 Image Brightness VIII-283 IQI Sensitivity VIII-284 Excessive Backscatter VIII-287 Dimensional Measuring VIII-288 Interpretation
103	VIII-290 Documentation VIII-291 Digital Imaging Technique Documentation Details
104	Mandatory Appendix IX Application of Digital Radiography IX-210 Scope IX-220 General Requirements IX-221 Procedure Requirements IX-225 Monitoring Density Limitations of Radiographs IX-230 Equipment and Materials IX-231 Film IX-232 Intensifying Screens IX-234 Facilities for Viewing of Radiographs IX-260 Calibration IX-262 Densitometer and Step Wedge Comparison Film IX-270 Examination IX-277 Use of IQIs to Monitor Radiographic Examination
105	IX-280 Evaluation IX-281 Quality of Radiographs IX-282 Image Brightness IX-283 IQI Sensitivity IX-284 Excessive Backscatter IX-287 Dimensional Measuring IX-288 Interpretation
106	IX-290 Documentation IX-291 Digital Imaging Technique Documentation Details
107	Nonmandatory Appendix A Recommended Radiographic Technique Sketches for Pipe or Tube Welds A-210 Scope
108	A-210-1 Single-Wall Radiographic Techniques
109	A-210-2 Double-Wall Radiographic Techniques
110	Nonmandatory Appendix C Hole-Type IQI Placement Sketches for Welds C-210 Scope
111	C-210-1 Side and Top Views of Hole-Type IQI Placements
112	C-210-2 Side and Top Views of Hole-Type IQI Placements
113	C-210-3 Side and Top Views of Hole-Type IQI Placements
114	C-210-4 Side and Top Views of Hole-Type IQI Placements
115	Nonmandatory Appendix D Number of IQIs (Special Cases) D-210 Scope D-210-1 Complete Circumference Cylindrical Component D-210-2 Section of Circumference 240 deg or More Cylindrical Component (Example is Alternate Intervals)
116	D-210-3 Section(s) of Circumference Less than 240 deg Cylindrical Component D-210-4 Section(s) of Circumference Equal to or More than 120 deg and Less than 240 deg Cylindrical Component Option D-210-5 Complete Circumferential Welds Spherical Component D-210-6 Welds in Segments of Spherical Component
117	D-210-7 Plan View A-A D-210-8 Array of Objects in a Circle
118	Article 4 Ultrasonic Examination Methods for Welds T-410 Scope T-420 General T-421 Written Procedure Requirements T-430 Equipment T-431 Instrument Requirements T-432 Search Units T-433 Couplant
119	T-434 Calibration Blocks T-421 Requirements of an Ultrasonic Examination Procedure
121	T-434.1.7.2 Ratio Limits for Curved Surfaces
122	T-434.2.1 Nonpiping Calibration Blocks
123	T-440 Miscellaneous Requirements T-441 Identification of Weld Examination Areas T-450 Techniques T-434.3-1 Calibration Block for Piping
124	T-434.3-2 Alternate Calibration Block for Piping
125	T-451 Coarse Grain Materials T-452 Computerized Imaging Techniques T-434.4.1 Calibration Block for Technique One
126	T-460 Calibration T-461 Instrument Linearity Checks T-462 General Calibration Requirements T-434.4.2.1 Alternate Calibration Block for Technique One
127	T-434.4.2.2 Alternate Calibration Block for Technique One T-434.4.3 Calibration Block for Technique Two
128	T-434.5.1 Calibration Block for Straight Beam Examination of Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal
129	T-463 Calibration for Nonpiping T-464 Calibration for Piping
130	T-465 Calibration for Weld Metal Overlay Cladding T-466 Calibration for Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal T-467 Calibration Confirmation
131	T-470 Examination T-471 General Examination Requirements T-472 Weld Joint Distance–Amplitude Technique
132	T-473 Weld Metal Overlay Cladding Techniques T-474 Nondistance–Amplitude Techniques T-475 Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal T-477 Post-Examination Cleaning T-480 Evaluation T-481 General
133	T-482 Evaluation Level T-483 Evaluation of Laminar Reflectors T-484 Alternative Evaluations T-490 Documentation T-491 Recording Indications T-492 Examination Records T-493 Report
134	T-494 Storage Media
135	Mandatory Appendix I Screen Height Linearity I-410 Scope I-440 Miscellaneous Requirements I-440 Linearity
136	Mandatory Appendix II Amplitude Control Linearity II-410 Scope II-440 Miscellaneous Requirements
137	Mandatory Appendix III Time of Flight Diffraction (TOFD) Technique III-410 Scope III-420 General III-422 Written Procedure Requirements III-430 Equipment III-431 Instrument Requirements III-432 Search Units III-422 Requirements of a TOFD Examination Procedure
138	III-434 Calibration Blocks III-435 Mechanics III-460 Calibration III-463 Calibration III-464 Calibration for Piping III-465 Calibration for Cladding
139	III-467 Encoder Confirmation III-470 Examination III-471 General Examination Requirements III-434.2.1(a) TOFD Reference Block
140	III-434.2.1(b) Two-Zone Reference Block Example III-463.5 Offset Scans
141	III-472 Weld Joint Distance–Amplitude Technique III-473 Cladding Technique III-475 Data Sampling Spacing III-480 Evaluation III-485 Missing Data Lines III-486 Flaw Sizing and Interpretation III-490 Documentation III-492 Examination Record III-493 Report
142	Mandatory Appendix IV Phased Array Manual Raster Examination Techniques Using Linear Arrays IV-410 Scope IV-420 General IV-422 Written Procedure Requirements IV-460 Calibration IV-461 Instrument Linearity Checks IV-462 General Calibration Requirements IV-490 Documentation IV-492 Examination Record IV-422 Requirements of a Phased Manual Raster Scanning Examination Procedure Using Linear Arrays
143	Mandatory Appendix V Phased Array E-Scan and S-Scan Linear Scanning Examination Techniques V-410 Scope V-420 General V-421.1 Requirements V-421.2 Procedure Qualification V-422 Scan Plan V-460 Calibration V-461 Instrument Linearity Checks V-462 General Calibration Requirements V-467 Encoder Calibration V-421 Requirements of a Phased Array Linear Scanning Examination Procedure Using Linear Arrays
144	V-470 Examination V-471 General Examination Requirements V-490 Documentation V-492 Examination Record
145	Mandatory Appendix VII Ultrasonic Examination Requirements for Workmanship Based Acceptance Criteria VII-410 Scope VII-420 General VII-421 Written Procedure Requirements VII-423 Personnel Qualifications VII-430 Equipment VII-431 Instrument Requirements VII-434 Calibration Blocks VII-440 Miscellaneous Requirements VII-442 Scanning Data VII-460 Calibration VII-466 Calibration for Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal VII-421 Requirements of an Ultrasonic Examination Procedure for Workmanship Based Acceptance Criteria
146	VII-470 Examination VII-471 General Examination Requirements VII-480 Evaluation VII-483 Evaluation of Laminar Reflectors VII-485 Evaluation VII-486 Supplemental Manual Techniques VII-487 Evaluation by Manufacturer VII-490 Documentation VII-492 Examination Record
147	Mandatory Appendix VIII Ultrasonic Examination Requirements for a Fracture Mechanics Based Acceptance Criteria VIII-410 Scope VIII-420 General VIII-421 Written Procedure Requirements VIII-423 Personnel Qualifications VIII-430 Equipment VIII-431 Instrument Requirements VIII-432 Search Units VIII-434 Calibration Blocks VIII-440 Miscellaneous Requirements VIII-442 Scanning Data VIII-421 Requirements of an Ultrasonic Examination Procedure for Fracture Mechanics Based Acceptance Criteria
148	VIII-460 Calibration VIII-466 Calibration for Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal VIII-470 Examination VIII-471 General Examination Requirements VIII-480 Evaluation VIII-482 Evaluation Level VIII-483 Evaluation of Laminar Reflectors VIII-485 Evaluation Settings VIII-486 Size and Category VIII-487 Supplemental Manual Techniques VIII-488 Evaluation by Manufacturer VIII-490 Documentation VIII-492 Examination Records
149	Mandatory Appendix IX Procedure Qualification Requirements for Flaw Sizing and Categorization IX-410 Scope IX-420 General IX-430 Equipment IX-435 Demonstration Blocks IX-440 Miscellaneous Requirements IX-442 Qualification Data IX-480 Evaluation IX-481 Size and Category
150	IX-482 Automated and Semi-Automated Acceptance Performance Criteria IX-483 Supplemental Manual Technique(s) Acceptable Performance IX-490 Documentation IX-492 Demonstration Block Record
151	Mandatory Appendix X Ultrasonic Examination of High Density Polyethylene X-410 Scope X-420 General X-421 Written Procedure Requirements X-422 Scan Plan X-430 Equipment X-431 Instrument Requirements X-432 Search Units X-421 Requirements of an Ultrasonic Examination Procedure for HDPE Techniques
152	X-434 Calibration Blocks X-460 Calibration X-462 General Calibration Requirements X-464 Calibration for Piping X-467 Calibration Confirmation
153	X-470 Examination X-471 General Examination Requirements X-490 Documentation X-492 Examination Record X-471.1 Fusion Pipe Joint Examination Volume
154	Nonmandatory Appendix A Layout of Vessel Reference Points A-410 Scope A-440 Miscellaneous Requirements A-441 Circumferential (Girth) Welds A-442 Longitudinal Welds A-443 Nozzle-to-Vessel Welds
155	Nonmandatory Appendix B General Techniques for Angle Beam Calibrations B-410 Scope B-460 Calibration B-461 Sweep Range Calibration B-461.1 Sweep Range (Side-Drilled Holes)
156	B-461.2 Sweep Range (IIW Block) B-461.3 Sweep Range (Notches)
157	B-462 Distance–Amplitude Correction B-462.1 Sensitivity and Distance–Amplitude Correction (Side-Drilled Holes)
158	B-463 Distance–Amplitude Correction Inner 1/4 Volume (See Nonmandatory Appendix J, Figure J-431 View A) B-464 Position Calibration (See Figure B-464) B-462.3 Sensitivity and Distance–Amplitude Correction (Notches)
159	B-465 Calibration Correction for Planar Reflectors Perpendicular to the Examination Surface at or Near the Opposite Surface (See Figure B-465) B-466 Beam Spread (See Figure B-466) B-464 Position Depth and Beam Path B-465 Planar Reflections
160	B-466 Beam Spread
161	Nonmandatory Appendix C General Techniques for Straight Beam Calibrations C-410 Scope C-460 Calibration C-461 Sweep Range Calibration (See Figure C-461) C-462 Distance–Amplitude Correction (See Figure C-462) C-461 Sweep Range
162	C-462 Sensitivity and Distance–Amplitude Correction
163	Nonmandatory Appendix D Examples of Recording Angle Beam Examination Data D-410 Scope D-420 General D-470 Examination Requirements D-471 Reflectors With Indication Amplitudes Greater Than 20% of DAC or Reference Level D-472 Reflectors With Indication Amplitudes Greater Than the DAC Curve or Reference Level D-473 Flaw Sizing Techniques to Be Qualified and Demonstrated D-490 Documentation
164	D-491 Reflectors With Indication Amplitudes Greater Than 20% of DAC or Reference Level D-490 Search Unit Location, Position, and Beam Direction D-490 Example Data Record
165	D-492 Reflectors With Indication Amplitudes Greater Than the DAC Curve or Reference Level D-493 Reflectors That Require Measurement Techniques to Be Qualified and Demonstrated
166	Nonmandatory Appendix E Computerized Imaging Techniques E-410 Scope E-420 General E-460 Calibration E-470 Examination E-471 Synthetic Aperture Focusing Technique for Ultrasonic Testing (SAFT-UT)
167	E-472 Line-Synthetic Aperture Focusing Technique (L-SAFT) E-473 Broadband Holography Technique
168	E-460.1 Lateral Resolution and Depth Discrimination Block for 45 deg and 60 deg Applications
169	E-474 UT-Phased Array Technique
170	E-460.2 Lateral and Depth Resolution Block for 0 deg Applications
171	E-475 UT-Amplitude Time-Of-Flight Locus-Curve Analysis Technique E-476 Automated Data Acquisition and Imaging Technique
172	Nonmandatory Appendix G Alternate Calibration Block Configuration G-410 Scope G-460 Calibration G-461 Determination of Gain Correction G-461 Transducer Factor F1 for Various Ultrasonic Transducer Diameters and Frequencies
173	G-461(a) Critical Radius, RC, for Transducer/Couplant Combinations
174	G-461(b) Correction Factor (Gain) for Various Ultrasonic Examination Parameters
175	Nonmandatory Appendix I Examination of Welds Using Angle Beam Search Units I-410 Scope I-470 Examination I-471 General Scanning Requirements I-472 Exceptions To General Scanning Requirements I-473 Examination Coverage
176	Nonmandatory Appendix J Alternative Basic Calibration Block J-410 Scope J-430 Equipment J-431 Basic Calibration Block J-432 Basic Calibration Block Material J-433 Calibration Reflectors
177	J-431 Basic Calibration Block
179	Nonmandatory Appendix K Recording Straight Beam Examination Data for Planar Reflectors K-410 Scope K-470 Examination K-471 Overlap K-490 Records/Documentation
180	Nonmandatory Appendix L TOFD Sizing Demonstration/Dual Probe — Computer Imaging Technique L-410 Scope L-420 General L-430 Equipment L-431 System L-432 Demonstration Block L-460 Calibration L-461 System L-462 System Checks L-470 Examination L-480 Evaluation L-481 Sizing Determinations L-482 Sizing Accuracy Determinations
181	L-483 Classification/Sizing System L-432 Example of a Flat Demonstration Block Containing Three Notches
182	L-490 Documentation L-491 Demonstration Report
183	Nonmandatory Appendix M General Techniques for Angle Beam Longitudinal Wave Calibrations M-410 Scope M-460 Calibration M-461 Sweep Range Calibration M-461.1 Sweep Range (Side-Drilled Holes)
184	M-461.2 Sweep Range (Cylindrical Surfaces) M-461.3 Sweep Range (Straight Beam Search Unit)
185	M-462 Distance–Amplitude Correction (DAC) (See Figure M-462) M-462 Sensitivity and Distance–Amplitude Correction
186	Nonmandatory Appendix N Time of Flight Diffraction (TOFD) Interpretation N-410 Scope N-420 General N-421 TOFD Images — Data Visualization N-421(a) Schematic Showing Waveform Transformation Into Grayscale
187	N-421(b) Schematic Showing Generation of Grayscale B-Scan From Multiple A-Scans N-421(c) Schematic Showing Standard TOFD Setup and Display With Waveform and Signal Phases
188	N-450 Procedure N-451 Measurement Tools N-452 Flaw Position Errors N-453 Measuring Flaw Length N-454 Measuring Flaw Depth N-421(d) TOFD Display With Flaws and Displayed A-Scan
189	N-480 Evaluation N-481 Single Flaw Images N-451 Measurement Tools for Flaw Heights N-452(a) Schematic Showing the Detection of Off-Axis Flaws
190	N-452(b) Measurement Errors From Flaw Position Uncertainty N-453 TOFD Image Showing Hyperbolic “Tails” From the Ends of a Flaw Image Used to Measure Flaw Length
191	N-454(a) TOFD Image Showing Top and Bottom Diffracted Signals From Midwall Flaw and A-Scan Interpretation N-454(b) TOFD Image Showing Top and Bottom Diffracted Signals From Centerline Crack and A-Scan Interpretation
192	N-482 Multiple Flaw Images N-481(a) Schematics of Image Generation, Scan Pattern, Waveform, and TOFD Display Showing the Image of the Point Flaw
193	N-481(b) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Inside (ID) Surface-Breaking Flaw N-481(c) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Outside (OD) Surface-Breaking Flaw
194	N-481(d) Schematics of Flaw Location, Signals, and TOFD Display Showing the Image of the Midwall Flaw N-481(e) Flaw Location and TOFD Display Showing the Image of the Lack of Root Penetration
195	N-483 Typical Problems With TOFD Interpretation N-481(f) Flaw Location and TOFD Display Showing the Image of the Concave Root Flaw N-481(g) Flaw Location, TOFD Display Showing the Image of the Midwall Lack of Fusion Flaw, and the A-Scan
196	N-481(h) Flaw Location and TOFD Display Showing the Image of the Porosity N-481(i) Flaw Location and TOFD Display Showing the Image of the Transverse Crack
197	N-481(j) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Interpass Lack of Fusion
198	N-482(a) Schematic of Flaw Locations and TOFD Image Showing the Lateral Wave, Backwall, and Three of the Four Flaws
199	N-482(b) Schematic of Flaw Locations and TOFD Display Showing the Lateral Wave, Backwall, and Four Flaws
200	N-483(a) Acceptable Noise Levels, Flaws, Lateral Wave, and Longitudinal Wave Backwall
201	N-483(b) TOFD Image with Gain Too Low
202	N-483(c) TOFD Image With Gain Set Too High N-483(d)(1) TOFD Image With the Gate Set Too Early
203	N-483(d)(2) TOFD Image With the Gate Set Too Late N-483(d)(3) TOFD Image With the Gate Set Too Long
204	N-483(e) TOFD Image With Transducers Set Too Far Apart N-483(f) TOFD Image With Transducers Set Too Close Together
205	N-483(g) TOFD Image With Transducers not Centered on the Weld Axis N-483(h) TOFD Image Showing Electrical Noise Interference
206	Nonmandatory Appendix O Time of Flight Diffraction (TOFD) Technique — General Examination Configurations O-410 Scope O-430 Equipment O-432 Search Units O-470 Examination O-432(a) Search Unit Parameters for Single Zone Examinations Up to 3 in. (75 mm) O-432(b) Search Unit Parameters for Multiple Zone Examinations Up to 12 in. (300 mm) Thick O-470 Recommended TOFD Zones for Butt Welds Up to 12 in. (300 mm) Thick
207	O-470(a) Example of a Single Zone TOFD Setup O-470(b) Example of a Two Zone TOFD Setup (Equal Zone Heights) O-470(c) Example of a Three Zone TOFD Setup (Unequal Zone Heights With Zone 3 Addressed by Two Offset Scans)
208	O-470(d) Example of a Four Zone TOFD Setup (Equal Zone Heights)
209	Nonmandatory Appendix P Phased Array (PAUT) Interpretation P-410 Scope P-420 General P-421 PAUT Images — Data Visualization P-450 Procedure P-451 Measurement Tools P-452 Flaw Sizing Techniques P-480 Evaluation
210	P-481 I.D. (Inside Diameter) Connected Crack P-421-1 Black and White (B&W) Version of Color Palette P-421-2 Scan Pattern Format
211	P-421-3 Example of an E-Scan Image Display
212	P-421-4 Example of an S-Scan Image Display P-452.1 Flaw Length Sizing Using Amplitude Drop Technique and the Vertical Cursors on the C-Scan Display
213	P-452.2-1 Scan Showing Flaw Height Sizing Using Amplitude Drop Technique and the Horizontal Cursors on the B-Scan Display P-452.2-2 Flaw Height Sizing Using Top Diffraction Technique and the Horizontal Cursors on the S-Scan Display
214	P-481 S-Scan of I.D. Connected Crack P-481.1 E-Scan of LOF in Midwall
215	P-481.2 S-Scan of Porosity, Showing Multiple Reflectors P-481.3 O.D. Toe Crack Detected Using S-Scan
216	P-481.4 IP Signal on S-Scan, Positioned on Root P-481.5 Slag Displayed as a Midwall Defect on S-Scan
217	Nonmandatory Appendix Q Example of a Split DAC Curve Q-410 Scope Q-420 General Q-421 First DAC Q-422 Second DAC Q-423 Notch Reflectors Q-410 Distance–Amplitude Correction
218	Q-421 First DAC Curve Q-422 Second DAC Curve
219	Nonmandatory Appendix R Straight Beam Calibration Blocks for Restricted Access Weld Examinations R-410 Scope R-420 General R-430 Equipment R-434 Calibration Blocks
220	R-434-1 Corner Weld Example
221	R-434-2 Tee Weld Example
222	Article 5 Ultrasonic Examination Methods for Materials T-510 Scope T-520 General T-521 Basic Requirements T-522 Written Procedure Requirements T-530 Equipment T-531 Instrument T-532 Search Units T-533 Couplant T-534 Calibration Block Requirements
223	T-560 Calibration T-561 Instrument Linearity Checks T-562 General Calibration Requirements T-522 Variables of an Ultrasonic Examination Procedure
224	T-534.3 Straight Beam Calibration Blocks for Bolting
225	T-563 Calibration Confirmation T-564 Casting Calibration for Supplementary Angle Beam Examinations T-570 Examination T-571 Examination of Product Forms
226	T-572 Examination of Pumps and Valves T-573 Inservice Examination T-574 Thickness Measurement T-577 Post-Examination Cleaning T-580 Evaluation T-590 Documentation T-591 Recording Indications T-592 Examination Records
227	T-593 Report T-594 Storage Media
228	Mandatory Appendix I Ultrasonic Examination of Pumps and Valves I-510 Scope I-530 Equipment I-531 Calibration Blocks I-560 Calibration I-561 System Calibration I-570 Examination
229	Mandatory Appendix II Inservice Examination of Nozzle Inside Corner Radius and Inner Corner Regions II-510 Scope II-530 Equipment II-531 Calibration Blocks II-560 Calibration II-561 System Calibration II-570 Examination
230	Mandatory Appendix III Glossary of Terms for Ultrasonic Examination
231	Mandatory Appendix IV Inservice Examination of Bolts IV-510 Scope IV-530 Equipment IV-531 Calibration Blocks IV-560 Calibration IV-561 DAC Calibration IV-570 Examination IV-571 General Examination Requirements
232	Article 6 Liquid Penetrant Examination T-610 Scope T-620 General T-621 Written Procedure Requirements T-630 Equipment T-640 Miscellaneous Requirements T-641 Control of Contaminants T-642 Surface Preparation
233	T-643 Drying After Preparation T-650 Technique T-651 Techniques T-621.1 Requirements of a Liquid Penetrant Examination Procedure T-621.3 Minimum and Maximum Time Limits for Steps in Penetrant Examination Procedures
234	T-652 Techniques for Standard Temperatures T-653 Techniques for Nonstandard Temperatures T-654 Technique Restrictions T-660 Calibration T-670 Examination T-671 Penetrant Application T-672 Penetration (Dwell) Time T-673 Excess Penetrant Removal
235	T-674 Drying After Excess Penetrant Removal T-675 Developing T-676 Interpretation T-672 Minimum Dwell Times
236	T-677 Post-Examination Cleaning T-680 Evaluation T-690 Documentation T-691 Recording of Indications T-692 Examination Records
237	Mandatory Appendix I Glossary of Terms for Liquid Penetrant Examination
238	Mandatory Appendix II Control of Contaminants for Liquid Penetrant Examination II-610 Scope II-640 Requirements II-641 Nickel Base Alloys II-642 Austenitic or Duplex Stainless Steel and Titanium II-690 Documentation
239	Mandatory Appendix III Qualification Techniques for Examinations at Nonstandard Temperatures III-610 Scope III-630 Materials III-640 Requirements III-641 Comparator Application III-630 Liquid Penetrant Comparator
241	Article 7 Magnetic Particle Examination T-710 Scope T-720 General T-721 Written Procedure Requirements T-730 Equipment T-731 Examination Medium T-740 Miscellaneous Requirements T-741 Surface Conditioning
242	T-750 Technique T-751 Techniques T-752 Prod Technique T-721 Requirements of a Magnetic Particle Examination Procedure
243	T-753 Longitudinal Magnetization Technique T-754 Circular Magnetization Technique
244	T-755 Yoke Technique T-756 Multidirectional Magnetization Technique T-754.2.1 Single-Pass and Two-Pass Central Conductor Technique T-754.2.2 The Effective Region of Examination When Using an Offset Central Conductor
245	T-760 Calibration T-761 Frequency of Calibration T-762 Lifting Power of Yokes T-763 Gaussmeters T-764 Magnetic Field Adequacy and Direction
246	T-765 Wet Particle Concentration and Contamination T-764.2(a) Pie-Shaped Magnetic Particle Field Indicator T-764.2(b)(1) Artificial Flaw Shims
247	T-764.2(b)(2) Artificial Flaw Shims
248	T-766 System Performance of Horizontal Units T-770 Examination T-771 Preliminary Examination T-772 Direction of Magnetization T-773 Method of Examination T-774 Examination Coverage T-775 Rectified Current
249	T-766.1 Ketos (Betz) Test Ring
250	T-776 Excess Particle Removal T-777 Interpretation T-778 Demagnetization T-779 Post-Examination Cleaning T-780 Evaluation
251	T-790 Documentation T-791 Multidirectional Magnetization Technique Sketch T-792 Recording of Indications T-793 Examination Records
252	Mandatory Appendix I Magnetic Particle Examination Using the AC Yoke Technique on Ferritic Materials Coated with Nonmagnetic Coatings I-710 Scope I-720 General I-721 Written Procedure Requirements I-722 Personnel Qualification I-721 Requirements of AC Yoke Technique on Coated Ferritic Component
253	I-723 Procedure/Technique Demonstration I-730 Equipment I-740 Miscellaneous Requirements I-741 Coating Thickness Measurement I-750 Technique I-751 Technique Qualification I-760 Calibration I-761 Yoke Maximum Lifting Force
254	I-762 Light Intensity Measurement I-770 Examination I-780 Evaluation I-790 Documentation I-791 Examination Record
255	Mandatory Appendix II Glossary of Terms for Magnetic Particle Examination
256	Mandatory Appendix III Magnetic Particle Examination Using the Yoke Technique with Fluorescent Particles in an Undarkened Area III-710 Scope III-720 General III-721 Written Procedure Requirements III-723 Procedure Demonstration III-750 Technique III-751 Qualification Standard III-760 Calibration III-761 Black Light Intensity Measurement III-762 White Light Intensity Measurement III-770 Examination III-721 Requirements for an AC or HWDC Yoke Technique With Fluorescent Particles in an Undarkened Area
257	III-777 Interpretation III-790 Documentation III-791 Examination Record
258	Mandatory Appendix IV Qualification of Alternate Wavelength Light Sources for Excitation of Fluorescent Particles IV-710 Scope IV-720 General IV-721 Written Procedure Requirements IV-723 Procedure Demonstration IV-750 Technique IV-751 Qualification Standard IV-752 Filter Glasses IV-770 Qualification Examinations IV-771 Black Light Intensity IV-772 Examination Requirements IV-721 Requirements for Qualifying Alternate Wavelength Light Sources for Excitation of Specific Fluorescent Particles
259	IV-773 Qualification of Alternate Wavelength Light Source and Specific Particles IV-790 Documentation IV-791 Examination Record
260	Mandatory Appendix V Requirements for the Use of Magnetic Rubber Techniques V-710 Scope V-720 General Requirements V-721 Written Procedure Requirements V-730 Equipment V-731 Magnetizing Apparatus V-732 Magnetic Rubber Materials V-733 Magnetic Field Strength V-734 Magnification V-740 Miscellaneous Requirements V-741 Surface Preparation
261	V-742 Taping and Damming V-743 Release Treatment V-750 Techniques V-751 Techniques V-752 Application of Magnetic Field V-721 Requirements for the Magnetic Rubber Examination Procedure
262	V-760 Calibration V-764 Magnetic Field Adequacy and Direction V-770 Examination V-773 Application of Liquid Polymer- Magnetic Particle Material V-774 Movement During Cure V-776 Removal of Replicas V-780 Evaluation V-790 Documentation V-793 Examination Records
263	Nonmandatory Appendix A Measurement of Tangential Field Strength with Gaussmeters A-710 Scope A-720 General Requirements A-730 Equipment A-750 Procedure A-790 Documentation/Records
264	Article 8 Eddy Current Examination T-810 Scope
265	Mandatory Appendix I Glossary of Terms for Eddy Current Examination
266	Mandatory Appendix II Eddy Current Examination of Nonferromagnetic Heat Exchanger Tubing II-810 Scope II-820 General II-821 Written Procedure Requirements II-822 Personnel Requirements II-830 Equipment
267	II-821 Requirements for an Eddy Current Examination Procedure
268	II-840 Requirements II-860 Calibration
269	II-860.3.1 Differential Technique Response From Calibration Reference Standard
270	II-870 Examination II-880 Evaluation II-890 Documentation II-860.3.2 Absolute Technique Response From Calibration Reference Standard
271	II-880 Flaw Depth as a Function of Phase Angle at 400 kHz [Ni–Cr–Fe 0.050 in. (1.24 mm) Wall Tube]
273	Mandatory Appendix III Eddy Current Examination on Coated Ferritic Materials III-810 Scope III-820 General III-821 Personnel Qualification III-822 Written Procedure Requirements III-823 Procedure Demonstration III-830 Equipment III-850 Technique III-860 Calibration
274	III-870 Examination III-890 Documentation III-891 Examination Report III-893 Record Retention
275	Mandatory Appendix IV External Coil Eddy Current Examination of Tubular Products IV-810 Scope IV-820 General IV-821 Performance IV-822 Personnel Qualification IV-823 Written Procedure Requirements IV-830 Equipment IV-831 Test Coils and Probes IV-823 Requirements of an External Coil Eddy Current Examination Procedure
276	IV-832 Scanners IV-833 Reference Specimen IV-850 Technique IV-860 Calibration IV-861 Performance Verification IV-862 Calibration of Equipment IV-870 Examination IV-880 Evaluation IV-890 Documentation IV-891 Examination Reports IV-893 Record Retention
277	Mandatory Appendix V Eddy Current Measurement of Nonconductive-Nonmagnetic Coating Thickness on a Nonmagnetic Metallic Material V-810 Scope V-820 General V-821 Written Procedure Requirements V-822 Personnel Qualification V-823 Procedure/Technique Demonstration V-830 Equipment V-831 Probes V-821 Requirements of an Eddy Current Examination Procedure for the Measurement of Nonconductive-Nonmagnetic Coating Thickness on a Metallic Material
278	V-850 Technique V-860 Calibration V-870 Examination V-880 Evaluation V-860 Typical Lift-off Calibration Curve for Coating Thickness Showing Thickness Calibration Points Along the Curve
279	V-890 Documentation V-891 Examination Report V-893 Record Retention
280	Mandatory Appendix VI Eddy Current Detection and Measurement of Depth of Surface Discontinuities in Nonmagnetic Metals with Surface Probes VI-810 Scope VI-820 General VI-821 Written Procedure Requirements VI-822 Personnel Qualification VI-823 Procedure/Technique Demonstration VI-821 Requirements of an Eddy Current Examination Procedure for the Detection and Measurement of Depth for Surface Discontinuities in Nonmagnetic Metallic Materials
281	VI-830 Equipment VI-831 Probes VI-832 Reference Specimen VI-850 Technique VI-860 Calibration VI-870 Examination VI-880 Evaluation
282	VI-890 Documentation VI-891 Examination Report VI-893 Record Retention VI-832 Reference Specimen VI-850 Impedance Plane Representations of Indications From Figure VI-832
283	Mandatory Appendix VII Eddy Current Examination of Magnetic and Nonmagnetic Conductive Metals to Determine if Flaws are Surface-Connected VII-810 Scope VII-820 General VII-821 Performance VII-822 Personnel Qualification VII-823 Written Procedure Requirements VII-830 Equipment VII-830.1 System Description VII-830.2 Surface Probes VII-830.3 Cables VII-830.4 Instrumentation VII-823 Requirements of an Eddy Current Surface Examination Procedure
284	VII-830.5 Reference Specimen VII-850 Technique VII-860 Calibration VII-861 General VII-830.5 Eddy Current Reference Specimen
285	VII-862 Calibration Response VII-870 Examination VII-880 Evaluation VII-890 Documentation VII-891 Examination Report VII-892 Record Retention
286	VII-862 Impedance Plane Responses for Stainless Steel and Carbon Steel Reference Specimens
287	Mandatory Appendix VIII Eddy Current Examination of Nonferromagnetic Heat Exchanger Tubing VIII-810 Scope VIII-820 General VIII-821 Written Procedure Requirements VIII-830 Equipment VIII-831 Data Acquisition System VIII-832 Analog Data Acquisition System
288	VIII-833 Digital Data Acquisition System VIII-834 Bobbin Coils VIII-821 Requirements for an Eddy Current Examination Procedure
289	VIII-850 Technique VIII-850.1 Probe Data Acquisition Speed VIII-850.2 Recording VIII-850.3 Automated Data Screening System VIII-860 Calibration VIII-861 Equipment Calibration VIII-862 Calibration Reference Standards VIII-863 Base Frequency
290	VIII-864 Set-up and Adjustment VIII-864.1 Differential Technique Response From Calibration Reference VIII-864.2 Absolute Technique From Calibration Reference Standard
291	VIII-870 Examination VIII-880 Evaluation VIII-880.1 Data Evaluation VIII-880.2 Means of Determining Indication Depth VIII-880.3 Frequencies Used for Data Evaluation VIII-890 Documentation VIII-890.1 Reporting VIII-890.2 Support Members VIII-890.3 Records
293	Article 9 Visual Examination T-910 Scope T-920 General T-921 Written Procedure Requirements T-922 Personnel Requirements T-923 Physical Requirements T-921 Requirements of a Visual Examination Procedure
294	T-930 Equipment T-950 Technique T-951 Applications T-952 Direct Visual Examination T-953 Remote Visual Examination T-954 Translucent Visual Examination T-980 Evaluation T-990 Documentation T-991 Report of Examination T-993 Record Maintenance
295	Mandatory Appendix I Glossary of Terms for Visual Examination
296	Article 10 Leak Testing T-1000 Introduction T-1010 Scope T-1020 General T-1030 Equipment
297	T-1040 Miscellaneous Requirements T-1050 Procedure T-1060 Calibration T-1070 Test T-1080 Evaluation T-1090 Documentation
299	Mandatory Appendix I Bubble Test — Direct Pressure Technique I-1000 Introduction I-1010 Scope I-1020 General I-1030 Equipment I-1070 Test I-1021 Requirements of a Direct Pressure Bubble Leak Testing Procedure
300	I-1080 Evaluation
301	Mandatory Appendix II Bubble Test — Vacuum Box Technique II-1000 Introduction II-1010 Scope II-1020 General II-1030 Equipment II-1021 Requirements of a Vacuum Box Leak Testing Procedure
302	II-1070 Test II-1080 Evaluation
303	Mandatory Appendix III Halogen Diode Detector Probe Test III-1000 Introduction III-1010 Scope III-1020 General III-1030 Equipment III-1060 Calibration
304	III-1070 Test III-1021 Requirements of a Halogen Diode Detector Probe Testing Procedure III-1031 Tracer Gases
305	III-1080 Evaluation
306	Mandatory Appendix IV Helium Mass Spectrometer Test — Detector Probe Technique IV-1000 Introduction IV-1010 Scope IV-1020 General IV-1030 Equipment IV-1060 Calibration
307	IV-1070 Test IV-1021 Requirements of a Helium Mass Spectrometer Detector Probe Testing Procedure
308	IV-1080 Evaluation
309	Mandatory Appendix V Helium Mass Spectrometer Test — Tracer Probe Technique V-1010 Scope V-1020 General V-1021 Written Procedure Requirements V-1030 Equipment V-1031 Instrument V-1032 Auxiliary Equipment V-1033 Calibration Leak Standard V-1060 Calibration V-1061 Instrument Calibration
310	V-1062 System Calibration V-1070 Test V-1071 Scanning Rate V-1072 Scanning Direction V-1073 Scanning Distance V-1074 Leakage Detection V-1075 Flow Rate V-1080 Evaluation V-1081 Leakage V-1021 Requirements of a Helium Mass Spectrometer Tracer Probe Testing Procedure
311	V-1082 Repair/Retest
312	Mandatory Appendix VI Pressure Change Test VI-1010 Scope VI-1020 General VI-1021 Written Procedure Requirements VI-1030 Equipment VI-1031 Pressure Measuring Instruments VI-1032 Temperature Measuring Instruments VI-1021 Requirements of a Pressure Change Testing Procedure
313	VI-1060 Calibration VI-1061 Pressure Measuring Instruments VI-1062 Temperature Measuring Instruments VI-1070 Test VI-1071 Pressure Application VI-1072 Vacuum Application VI-1073 Test Duration VI-1074 Small Pressurized Systems VI-1075 Large Pressurized Systems VI-1076 Start of Test VI-1077 Essential Variables VI-1080 Evaluation VI-1081 Acceptable Test VI-1082 Rejectable Test
314	Mandatory Appendix VII Glossary of Terms for Leak Testing
315	Mandatory Appendix VIII Thermal Conductivity Detector Probe Test VIII-1000 Introduction VIII-1010 Scope VIII-1020 General VIII-1030 Equipment VIII-1060 Calibration
316	VIII-1070 Test VIII-1021 Requirements of a Thermal Conductivity Detector Probe Testing Procedure VIII-1031 Tracer Gases
317	VIII-1080 Evaluation
318	Mandatory Appendix IX Helium Mass Spectrometer Test — Hood Technique IX-1010 Scope IX-1020 General IX-1021 Written Procedure Requirements IX-1030 Equipment IX-1031 Instrument IX-1032 Auxiliary Equipment IX-1021 Requirements of a Helium Mass Spectrometer Hood Testing Procedure
319	IX-1033 Calibration Leak Standard IX-1050 Technique IX-1051 Permeation IX-1052 Repetitive or Similar Tests IX-1060 Calibration IX-1061 Instrument Calibration IX-1062 System Calibration IX-1070 Test IX-1071 Standard Technique
320	IX-1072 Alternative Technique IX-1080 Evaluation IX-1081 Leakage IX-1082 Repair/Retest
321	Mandatory Appendix X Ultrasonic Leak Detector Test X-1000 Introduction X-1020 General X-1030 Equipment X-1060 Calibration X-1021 Requirements of an Ultrasonic Leak Testing Procedure
322	X-1070 Test X-1080 Evaluation
323	Nonmandatory Appendix A Supplementary Leak Testing Equation Symbols A-10 Applicability of the Formulas
324	Article 11 Acoustic Emission Examination of Fiber-Reinforced Plastic Vessels T-1110 Scope T-1120 General T-1121 Vessel Conditioning T-1122 Vessel Stressing T-1123 Vessel Support T-1121 Requirements for Reduced Operating Level Immediately Prior to Examination
325	T-1124 Environmental Conditions T-1125 Noise Elimination T-1126 Instrumentation Settings T-1127 Sensors T-1128 Procedure Requirements T-1130 Equipment T-1160 Calibration T-1161 System Calibration
326	T-1162 Sensor Locations and Spacings T-1163 Systems Performance Check T-1170 Examination T-1171 General Guidelines T-1172 Background Noise T-1173 Stressing
327	T-1173(a)(1) Atmospheric Vessels Stressing Sequence
328	T-1173(a)(2) Vacuum Vessels Stressing Sequence
329	T-1173(a)(3) Test Algorithm – Flowchart for Atmospheric Vessels
330	T-1173(b)(1) Pressure Vessel Stressing Sequence
331	T-1173(b)(2) Algorithm — Flowchart for Pressure Vessels
332	T-1174 AE Activity T-1175 Test Termination T-1180 Evaluation T-1181 Evaluation Criteria T-1182 Emissions During Load Hold, EH T-1183 Felicity Ratio Determination T-1181 Evaluation Criteria
333	T-1184 High Amplitude Events Criterion T-1185 Total Counts Criterion T-1190 Documentation T-1191 Report T-1192 Record
334	Mandatory Appendix I Instrumentation Performance Requirements I-1110 AE Sensors I-1111 High Frequency Sensors I-1112 Low Frequency Sensors I-1120 Signal Cable I-1130 Couplant I-1140 Preamplifier I-1150 Filters I-1160 Power-Signal Cable I-1161 Power Supply
335	I-1170 Main Amplifier I-1180 Main Processor I-1181 General I-1182 Peak Amplitude Detection I-1183 Signal Outputs and Recording
336	I-1183 Sample of Schematic of AE Instrumentation for Vessel Examination
337	Mandatory Appendix II Instrument Calibration II-1110 General II-1120 Threshold II-1130 Reference Amplitude Threshold II-1140 Count Criterion Nc and AM Value II-1150 Measurement of M II-1160 Field Performance
338	Mandatory Appendix III Glossary of Terms for Acoustic Emission Examination of Fiber-Reinforced Plastic Vessels
339	Nonmandatory Appendix A Sensor Placement Guidelines A-1110 Case 1 — Atmospheric Vertical Vessel
340	A-1120 Case 2 — Atmospheric Vertical Vessel
341	A-1130 Case 3 — Atmospheric/Pressure Vessel
342	A-1140 Case 4 — Atmospheric/Pressure Vertical Vessel
343	A-1150 Case 5 — Atmospheric/Vacuum Vertical Vessel
344	A-1160 Case 6 — Atmospheric/Pressure Horizontal Tank
345	Article 12 Acoustic Emission Examination of Metallic Vessels During Pressure Testing T-1210 Scope T-1220 General T-1221 Vessel Stressing T-1222 Noise Reduction T-1223 Sensors T-1224 Location of Acoustic Emission Sources
346	T-1225 Procedure Requirements T-1230 Equipment T-1260 Calibration T-1261 System Calibration T-1262 On-Site System Calibration T-1263 Attenuation Characterization T-1264 Sensor Location T-1265 Sensor Spacing
347	T-1266 Systems Performance Check T-1270 Examination T-1271 General Guidelines T-1272 Background Noise T-1273 Vessel Pressurization
348	T-1280 Evaluation T-1281 Evaluation Criteria T-1290 Documentation T-1291 Written Report T-1292 Record T-1273.2.1 An Example of Pressure Vessel Test Stressing Sequence
349	T-1273.2.2 An Example of In-Service, Pressure Vessel, Test Loading Sequence
350	T-1281 An Example of Evaluation Criteria for Zone Location
351	Mandatory Appendix I Instrumentation Performance Requirements I-1210 Acoustic Emission Sensors I-1220 Signal Cable I-1230 Couplant I-1240 Preamplifier I-1250 Filter I-1260 Power-Signal Cable I-1270 Power Supply I-1280 Main Amplifier I-1290 Main Processor I-1291 General
352	I-1292 Peak Amplitude Detection
353	Mandatory Appendix II Instrument Calibration and Cross-Referencing II-1210 Manufacturer’s Calibration II-1211 Annual Calibration II-1220 Instrument Cross-Referencing II-1221 Sensor Characterization
354	Mandatory Appendix III Glossary of Terms for Acoustic Emission Examination of Metal Pressure Vessels
355	Nonmandatory Appendix A Sensor Placement Guidelines A-1210 Case 1 — Vertical Pressure Vessel Dished Heads, Lug or Leg Supported
356	A-1220 Case 2 — Vertical Pressure Vessel Dished Heads, Agitated, Baffled Lug, or Leg Support
357	A-1230 Case 3 — Horizontal Pressure Vessel Dished Heads, Saddle Supported
358	A-1240 Case 4 — Vertical Pressure Vessel Packed or Trayed Column Dished Heads, Lug or Skirt Supported
359	A-1250 Case 5 — Spherical Pressure Vessel, Leg Supported
360	Nonmandatory Appendix B Supplemental Information for Conducting Acoustic Emission Examinations B-10 Frequency Selection B-20 Combining More than One Sensor in a Single Channel B-30 Attenuative Welds B-40 Production Line Testing of Identical Vessels
361	Article 13 Continuous Acoustic Emission Monitoring of Pressure Boundary Components T-1310 Scope T-1311 References T-1320 General T-1321 Relevant Indications T-1322 Personnel Qualification T-1323 Written Procedures
362	T-1330 Equipment T-1331 General T-1332 AE Sensors T-1331 Functional Flow Diagram — Continuous AE Monitoring System
363	T-1333 Signal Cables T-1334 Amplifiers T-1335 AE Instrument and Monitor T-1332.2 Response of a Waveguide AE Sensor Inductively Tuned to 500 kHz
364	T-1340 Miscellaneous Requirements T-1341 Equipment Verification T-1342 Sensor Calibration T-1343 Signal Pattern Recognition
365	T-1344 Material Attenuation/Characterization T-1345 Background Noise T-1346 Verification Records T-1347 Sensor Installation T-1348 Signal Lead Installation T-1349 AE Monitor Installation T-1350 Technique/Procedure Requirements
366	T-1351 AE System Operation T-1352 Data Processing, Interpretation, and Evaluation T-1353 Data Recording and Storage T-1354 Component Loading T-1355 Noise Interference T-1356 Coordination with Plant System Owner/Operator
367	T-1357 Source Location and Sensor Mounting T-1360 Calibration T-1361 Sensors T-1362 Complete AE Monitor System T-1363 Verification Intervals T-1364 Verification Records T-1370 Examination T-1371 Plant Startup and Shutdown T-1373 Plant Steady-State Operation
368	T-1374 Nuclear Metal Components T-1375 Non-Nuclear Metal Components T-1376 Nonmetallic Components T-1377 Limited Zone Monitoring T-1378 Hostile Environment Applications T-1379 Leak Detection Applications T-1380 Evaluation/Results T-1381 Data Processing, Interpretation, and Evaluation T-1382 Data Requirements T-1390 Reports/Records T-1391 Reports to Plant System Owner/Operator T-1392 Records
369	T-1393 Record Retention Requirements
370	Mandatory Appendix I Nuclear Components I-1310 Scope I-1330 Equipment I-1331 Preamplifiers I-1332 AE Sensors I-1333 Frequency Response I-1334 Signal Processing I-1340 Miscellaneous Requirements I-1341 Equipment Qualification I-1360 Calibration I-1361 Calibration Block I-1362 Calibration Interval I-1380 Evaluation
372	Mandatory Appendix II Non-Nuclear Metal Components II-1310 Scope II-1330 Equipment II-1331 Sensors II-1333 Amplifiers II-1334 Main Processor
373	II-1360 Calibration II-1361 System Performance Check II-1362 System Performance Check Verification II-1380 Evaluation II-1381 Evaluation Criteria — Zone Location II-1382 Evaluation Criteria — Multisource Location II-1381 An Example of Evaluation Criteria for Zone Location II-1382 An Example of Evaluation Criteria for Multisource Location
374	Mandatory Appendix III Nonmetallic Components III-1310 Scope III-1320 General III-1321 Applications III-1330 Equipment III-1331 Sensors III-1332 Source Location Accuracy III-1360 Calibration III-1361 III-1362 III-1363 III-1364
375	III-1380 Evaluation III-1381 Evaluation Criteria III-1382 Source Mechanism
376	Mandatory Appendix IV Limited Zone Monitoring IV-1310 Scope IV-1320 General IV-1321 Guard Sensor Technique IV-1340 Miscellaneous Requirements IV-1341 Redundant Sensors IV-1350 Technique IV-1351 Techniques IV-1352 Procedure IV-1353 Other Techniques IV-1360 Calibration IV-1380 Evaluation
377	IV-1390 Documentation
378	Mandatory Appendix V Hostile Environment Applications V-1310 Scope V-1330 Equipment V-1331 AE Sensors V-1332 AE Sensor Types V-1333 Waveguide V-1334 AE Signal Transmission V-1340 Miscellaneous Requirements V-1341 Sensor Mounting
379	V-1333 Metal Waveguide AE Sensor Construction
380	V-1341 Mounting Fixture for Steel Waveguide AE Sensor
381	Mandatory Appendix VI Leak Detection Applications VI-1310 Scope VI-1320 General VI-1330 Equipment VI-1331 Sensor Type VI-1332 Waveguide
382	VI-1333 Electronic Filters VI-1350 Technique VI-1351 Procedure VI-1360 Calibration VI-1361 Calibration Checks VI-1370 Examination VI-1371 Implementation of System Requirements VI-1372 Verification Procedure VI-1373 Equipment Qualification and Calibration Data VI-1380 Evaluation VI-1381 Leak Indications VI-1382 Leak Location
383	Mandatory Appendix VII Glossary of Terms for Acoustic Emission Examination
384	Article 14 Examination System Qualification T-1410 Scope T-1420 General Requirements T-1421 The Qualification Process T-1422 Technical Justification T-1423 Performance Demonstration T-1424 Levels of Rigor
385	T-1425 Planning a Qualification Demonstration T-1430 Equipment T-1440 Application Requirements T-1441 Technical Justification Report
386	T-1442 Performance Demonstration
387	T-1443 Examination System Requalification T-1450 Conduct of Qualification Demonstration T-1451 Protocol Document T-1452 Individual Qualification
388	T-1460 Calibration T-1470 Examination T-1471 Intermediate Rigor Detection Test T-1472 High Rigor Detection Tests
389	T-1472.1 Total Number of Samples for a Given Number of Misses at a Specified Confidence Level and POD T-1472.2 Required Number of First Stage Examiners vs. Target Pass Rate
390	T-1480 Evaluation T-1490 Documentation and Records
391	Mandatory Appendix I Glossary of Terms for Examination System Qualification
392	Mandatory Appendix II UT Performance Demonstration Criteria II-1410 Scope II-1420 General II-1430 Equipment II-1434 Qualification Blocks II-1440 Application Requirements
393	II-1450 Conduct of Qualification Demonstration II-1434 Flaw Characterization for Tables II-1434-1 and II-1434-2 II-1434-1 Flaw Acceptance Criteria for 4 in. to 12 in. Thick Weld II-1434-2 Flaw Acceptance Criteria for Larger Than 12 in. Thick Weld
394	II-1460 Calibration II-1470 Examination II-1480 Evaluation II-1481 Low Level II-1482 Intermediate Level II-1483 High Level II-1490 Documentation
395	Article 15 Alternating Current Field Measurement Technique (ACFMT) T-1510 Scope T-1520 General T-1521 Supplemental Requirements T-1522 Written Procedure Requirements T-1530 Equipment T-1531 Instrument T-1532 Probes T-1533 Calibration Blocks
396	T-1540 Miscellaneous Requirements T-1541 Surface Conditioning T-1542 Demagnetization T-1543 Identification of Weld Examination Areas T-1560 Calibration T-1561 General Requirements T-1562 Calibration T-1522 Requirements of an ACFMT Examination Procedure
397	T-1563 Performance Confirmation T-1533 ACFMT Calibration Block
398	T-1570 Examination T-1571 General Examination Requirements T-1572 Examination Coverage T-1573 Overlap T-1574 Interpretation T-1580 Evaluation T-1590 Documentation T-1591 Recording Indication T-1592 Examination Record T-1593 Report
399	Article 16 Magnetic Flux Leakage (MFL) Examination T-1610 Scope T-1620 General T-1621 Personnel Qualification Requirements T-1622 Equipment Qualification Requirements T-1623 Written Procedure Requirements
400	T-1630 Equipment T-1640 Requirements T-1650 Calibration T-1660 Examination T-1622.1.1 Reference Plate Dimensions
401	T-1670 Evaluation T-1680 Documentation T-1622.1.2 Reference Pipe or Tube Dimensions T-1623 Requirements of an MFL Examination Procedure
403	Article 17 Remote Field Testing (RFT) Examination Method T-1710 Scope T-1720 General T-1721 Written Procedure Requirements T-1722 Personnel Requirements T-1730 Equipment T-1750 Technique T-1721 Requirements of an RFT Examination Procedure
404	T-1760 Calibration T-1761 Instrument Calibration T-1762 System Preparation T-1763 System Set-up and Calibration T-1762 Pit Reference Tube (Typical)
405	T-1763.1(a) Voltage Plane Display of Differential Channel Response for Through-Wall Hole (Through-Hole Signal) and 20% Groove Showing Preferred Angular Relationship T-1763.1(b) Voltage Plane Display of Differential Channel Response for the Tube Support Plate (TSP), 20% Groove, and Through-Wall Hole (Through-Hole Signal)
406	T-1764 Auxiliary Frequency(s) Calibration Procedure T-1765 Calibration Confirmation T-1766 Correlation of Signals to Estimate Depth of Flaws T-1770 Examination T-1771 General T-1772 Probe Speed T-1780 Evaluation T-1790 Documentation T-1763.2 Reference Curve and the Absolute Channel Signal Response From Two Circumferential Grooves and a Tube Support Plate
407	T-1793 Record Retention
408	Article 18 Acoustic Pulse Reflectometry (APR) Examination T-1810 Scope T-1820 General T-1821 Written Procedure Requirements T-1830 Equipment T-1831 Instrumentation T-1832 Reference Specimen T-1821 Requirements of an Acoustic Pulse Reflectometry Examination Procedure
409	T-1832 Reference Specimens
410	T-1840 Miscellaneous Requirements T-1841 Tube or Pipe Precleaning T-1850 Prior to the Examination T-1860 Calibration T-1861 Instrument Calibration T-1862 System Preparation T-1863 System Setup T-1864 Functional Test
411	T-1865 Analysis of Signals to Determine Flaw Type and Estimate Flaw Size T-1870 Examination T-1880 Evaluation T-1890 Documentation T-1891 Recording Indications T-1892 Examination Records T-1893 Storage Media
412	T-1865.1 Signal Analysis From Various Types of Discontinuities T-1865.2 Reflection From a Through-Wall Hole
413	Article 19 Guided Wave Examination Method for Piping T-1910 Scope T-1920 General T-1921 Written Procedure Requirements T-1922 Personnel Qualification T-1930 Equipment T-1931 Instrumentation Requirements T-1932 Sensors T-1950 Wave Modes
414	T-1951 Miscellaneous Requirements T-1960 Calibration T-1961 Instrument Calibration T-1921.1 Requirements of a GWT Examination Procedure
415	T-1962 System Calibration T-1963 Distance–Amplitude Correction (DAC) or Time-Corrected Gain (TCG) T-1964 Detection Threshold T-1965 Call Level T-1970 Examination T-1971 Examination Coverage T-1980 Evaluation T-1981 General T-1982 Evaluation Level T-1990 Documentation T-1992 Examination Records
417	Nonmandatory Appendix A Operation of GWT Systems A-1910 Scope A-1920 General
418	A-1921 Call Level A-1922 Effect of Pipe Geometry on Examination Range A-1920 Illustration of the Guided Wave Examination Procedure
419	A-1923 Effect of Pipe Coating A-1924 Effect of General Corrosion on Examination Range A-1925 Special Applications of Guided Wave Testing
420	Subsection B Documents Adopted by Section V
421	Article 22 Radiographic Standards
422	SE-94
436	SE-747
452	SE-999
458	SE-1025
466	SE-1030
478	SE-1114
484	SE-1165
492	SE-1255
504	SE-1416
510	SE-1647
515	Article 23 Ultrasonic Standards
516	SA-388/SA-388M
526	SA-435/SA-435M
530	SA-577/SA-577M
534	SA-578/SA-578M
542	SA-609/SA-609M
552	SA-745/SA-745M
558	SB-548
564	SE-213
578	SE-273
584	SE-797/SE-797M
592	SE-2491
612	SE-2700
622	Article 24 Liquid Penetrant Standards
624	SD-129
630	SD-516
636	SD-808
642	SE-165/SE-165M
661	Article 25 Magnetic Particle Standards
662	SD-1186
668	SE-709
717	Article 26 Eddy Current Standards
718	SE-243
726	SE-2096/SE-2096M
736	Article 29 Acoustic Emission Standards
738	SE-650/SE-650M
742	SE-750
754	E-976-10
764	SE-1067/SE-1067M
780	SE-1118/SE-1118M
794	SE-1139
802	SE-1211/SE-1211M
808	SE-1419
817	Article 30 Terminology for Nondestructive Examinations Standard
818	SE-1316
856	Article 31 Alternating Current Field Measurement Standard
858	SE-2261
871	Mandatory Appendices Mandatory Appendix II Standard Units for Use in Equations II-1 Standard Units for Use in Equations
872	Nonmandatory Appendices Nonmandatory Appendix A Guidance for the Use of U.S. Customary and SI Units in the ASME Boiler and Pressure Vessel Code A-1 Use of Units in Equations A-2 Guidelines Used to Develop SI Equivalents
874	A-3 Soft Conversion Factors
876	Endnotes