UNE-EN 60749-35:2006:2007 Edition
$22.75
Semiconductor devices – Mechanical and climatic test methods — Part 35: Acoustic microscopy for plastic encapsulated electronic components
| Published By | Publication Date | Number of Pages |
| AENOR | 2007-01-01 | 25 |
| Published Code | AENOR |
|---|---|
| Published By | Asociación Española de Normalización |
| Publication Date | 2007-01-01 |
| Pages Count | 25 |
| Language | English |
| File Size | 573.4 KB |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
