IEC 62506:2013 provides guidance on the application of various accelerated test techniques for measurement or improvement of product reliability. Identification of potential failure modes that could be experienced in the use of a product\/item and their mitigation is instrumental to ensure dependability of an item. The object of the methods is to either identify potential design weakness or provide information on item dependability, or to achieve necessary reliability\/availability improvement, all within a compressed or accelerated period of time. This standard addresses accelerated testing of non-repairable and repairable systems. It can be used for probability ratio sequential tests, fixed duration tests and reliability improvement\/growth tests, where the measure of reliability may differ from the standard probability of failure occurrence. This standard also extends to present accelerated testing or production screening methods that would identify weakness introduced into the product by manufacturing error, which could compromise product dependability. Keywords: test techniques for measurement or improvement of product reliability<\/p>\n
| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 6<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 3 Terms, definitions, symbols and abbreviations 3.1 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 3.2 Symbols and abbreviated terms <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 4 General description of the accelerated test methods 4.1 Cumulative damage model <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | Figures Figure 1 \u2013 Probability density functions (PDF) for cumulative damage, degradation, and test types <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 4.2 Classification, methods and types of test acceleration 4.2.1 General Tables Table 1 \u2013 Test types mapped to the product development cycle <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 4.2.2 Type A: qualitative accelerated tests 4.2.3 Type B: quantitative accelerated tests <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 4.2.4 Type C: quantitative time and event compressed tests <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 5 Accelerated test models 5.1 Type A, qualitative accelerated tests 5.1.1 Highly accelerated limit tests (HALT) <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | Figure 2 \u2013 Relationship of PDFs of the product strength vs. load in use <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | Figure 3 \u2013 How uncertainty of load and strength affects the test policy <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | Figure 4 \u2013 PDFs of operating and destruct limits as a function of applied stress <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | 5.1.2 Highly accelerated stress test (HAST) 5.1.3 Highly accelerated stress screening\/audit (HASS\/HASA) <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | 5.1.4 Engineering aspects of HALT and HASS <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | 5.2 Type B and C \u2013 Quantitative accelerated test methods 5.2.1 Purpose of quantitative accelerated testing 5.2.2 Physical basis for the quantitative accelerated Type B test methods <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 5.2.3 Type C tests, time (C1) and event (C2) compression <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | 5.3 Failure mechanisms and test design <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | 5.4 Determination of stress levels, profiles and combinations in use and test \u2013 stress modelling 5.4.1 General 5.4.2 Step-by-step procedure 5.5 Multiple stress acceleration methodology \u2013 Type B tests <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | 5.6 Single and multiple stress acceleration for Type B tests 5.6.1 Single stress acceleration methodology <\/td>\n<\/tr>\n | ||||||
| 36<\/td>\n | Figure 5 \u2013 Line plot for Arrhenius reaction model <\/td>\n<\/tr>\n | ||||||
| 37<\/td>\n | Figure 6 \u2013 Plot for determination of the activation energy <\/td>\n<\/tr>\n | ||||||
| 39<\/td>\n | 5.6.2 Stress models with stress varying as a function of time \u2013 Type B tests <\/td>\n<\/tr>\n | ||||||
| 40<\/td>\n | 5.6.3 Stress models that depend on repetition of stress applications \u2013 Fatigue models <\/td>\n<\/tr>\n | ||||||
| 42<\/td>\n | 5.6.4 Other acceleration models \u2013 Time and event compression 5.7 Acceleration of quantitative reliability tests 5.7.1 Reliability requirements, goals, and use profile <\/td>\n<\/tr>\n | ||||||
| 44<\/td>\n | 5.7.2 Reliability demonstration or life tests <\/td>\n<\/tr>\n | ||||||
| 47<\/td>\n | Figure 7 \u2013 Multiplier of the test stress duration for demonstration ofrequired reliability for compliance or reliability growth testing <\/td>\n<\/tr>\n | ||||||
| 48<\/td>\n | Figure 8 \u2013 Multiplier of the duration of the load application for the desired reliability <\/td>\n<\/tr>\n | ||||||
| 49<\/td>\n | 5.7.3 Testing of components for a reliability measure <\/td>\n<\/tr>\n | ||||||
| 50<\/td>\n | 5.7.4 Reliability measures for components and systems\/items 5.8 Accelerated reliability compliance or evaluation tests <\/td>\n<\/tr>\n | ||||||
| 52<\/td>\n | 5.9 Accelerated reliability growth testing 5.10 Guidelines for accelerated testing 5.10.1 Accelerated testing for multiple stresses and the known use profile <\/td>\n<\/tr>\n | ||||||
| 53<\/td>\n | 5.10.2 Level of accelerated stresses 5.10.3 Accelerated reliability and verification tests 6 Accelerated testing strategy in product development 6.1 Accelerated testing sampling plan <\/td>\n<\/tr>\n | ||||||
| 54<\/td>\n | 6.2 General discussion about test stresses and durations <\/td>\n<\/tr>\n | ||||||
| 55<\/td>\n | 6.3 Testing components for multiple stresses 6.4 Accelerated testing of assemblies 6.5 Accelerated testing of systems 6.6 Analysis of test results 7 Limitations of accelerated testing methodology <\/td>\n<\/tr>\n | ||||||
| 57<\/td>\n | Annex A (informative) Highly accelerated limit test (HALT) <\/td>\n<\/tr>\n | ||||||
| 58<\/td>\n | Table A.1 \u2013 Summary of HALT test results for a DC\/DC converter <\/td>\n<\/tr>\n | ||||||
| 59<\/td>\n | Table A.2 \u2013 Summary of HALT results from a medical system <\/td>\n<\/tr>\n | ||||||
| 60<\/td>\n | Table A.3 \u2013 Summary of HALT results for a Hi-Fi equipment <\/td>\n<\/tr>\n | ||||||
| 61<\/td>\n | Annex B (informative) Accelerated reliability compliance and growth test design <\/td>\n<\/tr>\n | ||||||
| 63<\/td>\n | Figure B.1 \u2013 Reliability as a function of multiplier kand for combinations of parameters a and b <\/td>\n<\/tr>\n | ||||||
| 65<\/td>\n | Table B.1 \u2013 Environmental stress conditions of anautomotive electronic device <\/td>\n<\/tr>\n | ||||||
| 66<\/td>\n | Figure B.2 \u2013 Determination of the multiplier k <\/td>\n<\/tr>\n | ||||||
| 69<\/td>\n | Table B.2 \u2013 Product use parameters <\/td>\n<\/tr>\n | ||||||
| 73<\/td>\n | Table B.3 \u2013 Assumed product use profile <\/td>\n<\/tr>\n | ||||||
| 74<\/td>\n | Table B.4 \u2013 Worksheet for determination of use times to failures <\/td>\n<\/tr>\n | ||||||
| 75<\/td>\n | Figure B.3 \u2013 Determination of the growth rate Table B.5 \u2013 Data for reliability growth plotting <\/td>\n<\/tr>\n | ||||||
| 76<\/td>\n | Annex C (informative) Comparison between HALT and conventional accelerated testing Table C.1 \u2013 Comparison between HALT and conventional accelerated testing <\/td>\n<\/tr>\n | ||||||
| 77<\/td>\n | Annex D (informative) Estimating the activation energy, Ea <\/td>\n<\/tr>\n | ||||||
| 78<\/td>\n | Figure D.1 \u2013 Plotting failures to estimate the activation energy Ea <\/td>\n<\/tr>\n | ||||||
| 79<\/td>\n | Annex E (informative) Calibrated accelerated life testing (CALT) <\/td>\n<\/tr>\n | ||||||
| 81<\/td>\n | Annex F (informative) Example on how to estimate empirical factors <\/td>\n<\/tr>\n | ||||||
| 82<\/td>\n | Table F.1 – Probability of failure of test samples A and B Table F.2 \u2013 Data transformation for Weibull plotting <\/td>\n<\/tr>\n | ||||||
| 83<\/td>\n | Figure F.1 \u2013 Weibull graphical data analysis <\/td>\n<\/tr>\n | ||||||
| 84<\/td>\n | Figure F.2 \u2013 Scale parameter as a function of the temperature range <\/td>\n<\/tr>\n | ||||||
| 85<\/td>\n | Figure F.3 \u2013 Probability of failure as a function of number of cycles \u0394T = 50 \u00b0C <\/td>\n<\/tr>\n | ||||||
| 86<\/td>\n | Annex G (informative) Determination of acceleration factors by testing to failure Table G.1 \u2013 Voltage test failure data for Weibull distribution <\/td>\n<\/tr>\n | ||||||
| 87<\/td>\n | Figure G.1 \u2013 Weibull plot of the three data sets <\/td>\n<\/tr>\n | ||||||
| 88<\/td>\n | Figure G.2 \u2013 Scale parameters\u2019 values fitted with a power line <\/td>\n<\/tr>\n | ||||||
| 89<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Methods for product accelerated testing<\/b><\/p>\n |