This document specifies the necessary information required in a report of analytical results based on measurements of the intensities of peaks in Auger electron and X-ray photoelectron spectra. Information on methods for the measurement of peak intensities and on uncertainties of derived peak areas is also provided.<\/p>\n
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| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 6<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
| 7<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions 4 Symbols and abbreviated terms <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 5 Methods for peak-intensity determination \u2014 direct spectrum 5.1 General <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 5.2 Selection and subtraction of an inelastic background <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 5.3 Measurement of peak intensity 5.3.1 Measurement of peak height 5.3.2 Measurement of peak area <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 5.4 Measurement of a peak intensity with computer software 5.5 Measurement of peak intensities for a spectrum with overlapping peaks <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 5.6 Uncertainty in measurement of peak area <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | 6 Methods for peak intensity determination \u2014 Auger-electron differential spectrum 6.1 General 6.2 Measurement of Auger-electron differential intensity <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 6.3 Uncertainties in measurement of Auger-electron differential intensity <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 7 Reporting of methods used to measure peak intensities 7.1 General requirements 7.2 Methods used to determine peak intensities in direct spectra 7.2.1 Intensity measurement for a single peak, as described in 5.2 and 5.3 <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 7.2.2 Intensity measurements from peak fitting, as described in 5.4 and 5.5 7.3 Methods used to obtain and determine peak intensities in Auger-electron differential spectra 7.3.1 Method used to obtain differential spectra 7.3.2 Method used to determine peak intensities, as described in 6.2 <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | Annex A (informative) Instrumental effects on measured intensities <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | Annex B (informative) Useful integration limits for determination of peak intensities in XPS spectra <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results<\/b><\/p>\n |