IEC 60749-17:2003
$13.65
Semiconductor devices – Mechanical and climatic test methods – Part 17: Neutron irradiation
| Published By | Publication Date | Number of Pages |
| IEC | 2003-02-20 | 20 |
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
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