BSI 12/30268616 DC:2012 Edition
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BS EN 61747-1-1. Liquid crystal display devices. Generic. Generic specification
| Published By | Publication Date | Number of Pages |
| BSI | 2012 | 25 |
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 7 | 1 Scope 2 Normative references |
| 8 | 3 Terminology 4 Technical aspects 4.1 Order of precedence 4.2 Standard environmental conditions 4.3 Marking 4.3.1 Device identification 4.3.2 Device traceabillity 4.3.3 Packing 4.4 Categories of assessed quality |
| 9 | 4.5 Screening 4.6 Handling 5 Quality assessment procedures 5.1 General 5.2 Eligibility for qualification approval 5.2.1 Primary stage of manufacture 5.3 Commercially confidential information |
| 10 | 5.4 Formation of inspection lots 5.5 Structurally similar devices 5.6 Granting of qualification approval 5.7 Quality conformance inspection 5.7.1 General 5.7.2 Division into groups and subgroups 5.7.2.1 Group A inspection (lot-by-lot) |
| 11 | 5.7.2.2 Group B inspection (lot-by-lot, except for category I, see 4.5) 5.7.2.3 Group C inspection (periodic) 5.7.2.4 Division of group B and group C into subgroups |
| 12 | 5.7.2.5 Group D inspection 5.7.3 Inspection requirements 5.7.3.1 Criteria for lot rejection 5.7.3.2 Re-submitted lots 5.7.3.3 Procedure in case of test equipment failure or operator error 5.7.3.4 Procedure in case of failure in periodic tests 5.7.4 Supplementary procedure for reduced inspection 5.7.4.1 Group B 5.7.4.2 Group C |
| 13 | 5.7.5 Sampling requirements for small lots 5.7.6 Certified records of released lots (CRRL) 5.7.7 Delivery of devices subjected to destructive or non-destructive tests 5.7.8 Delayed deliveries 5.7.9 Supplementary procedure for deliveries 5.8 Statistical sampling procedures 5.8.1 AQL sampling plans 5.8.2 LTPD sampling plans 5.9 Endurance tests 5.10 Endurance tests where the failure rate is specified 5.10.1 General |
| 14 | 5.10.2 Selection of samples 5.10.3 Failure 5.10.4 Endurance test time and sample size 5.10.5 Procedure to be used if the number of observed failures exceeds theacceptance number 5.10.5.1 Additional samples 5.10.5.2 Extension of endurance test period 5.11 Accelerated test procedures |
| 15 | 5.12 Capability approval 6 Test and measurement procedures 6.1 Standard atmospheric conditions for electrical and optical measurements 6.2 Physical examination 6.2.1 Visual examination 6.2.2 Dimensions 6.2.3 Permanence of marking 6.2.3.1 Conditions 6.2.3.2 Initial and final measurement 6.3 Electrical and optical measurements 6.3.1 General conditions and precautions 6.3.1.1 Alternative methods |
| 16 | 6.3.1.2 Precision of measurements 6.3.1.3 General precautions 6.4 Environmental tests 6.5 Mechanical tests |
| 17 | Annex A (informative)Example of outline drawings of liquid crystal display cells |
| 19 | Annex B (normative)Orientation of LCD modules |
| 20 | Annex C (informative)Lot tolerance percentage defective (LTPD) sampling plans C.1 General C.1.1 Selection of samples C.1.2 Failures C.2 Single-lot sampling method C.2.1 Sample size C.2.2 Acceptance procedure |
| 21 | C.3 Additional sample C.4 Multiple criteria C.5 100 % inspection C.6 Tightened inspection |
