BS EN 61788-16:2013
$167.15
Superconductivity – Electronic characteristic measurements. Power-dependent surface resistance of superconductors at microwave frequencies
| Published By | Publication Date | Number of Pages |
| BSI | 2013 | 34 |
IEC 61788-16:2013 involves describing the standard measurement method of power-dependent surface resistance of superconductors at microwave frequencies by the sapphire resonator method. The measuring item is the power dependence of Rs at the resonant frequency. This method is the applicable for a frequency in the range of 10 GHz, for an input microwave power lower than 37 dBm (5 W). The aim is to report the surface resistance data at the measured frequency and that scaled to 10 GHz. Keyword: superconductivity
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | English CONTENTS |
| 8 | INTRODUCTION |
| 9 | 1 Scope 2 Normative references 3 Terms and definitions |
| 10 | 4 Requirements 5 Apparatus 5.1 Measurement system 5.1.1 Measurement system for the tan δ of the sapphire rod |
| 11 | 5.1.2 Measurement system for the power dependence of the surface resistance of superconductors at microwave frequencies Figure 1 – Measurement system for tan δ of the sapphire rod Figure 2 – Measurement system for the microwave power dependence of the surface resistance |
| 12 | 5.2 Measurement apparatus 5.2.1 Sapphire resonator 5.2.2 Sapphire rod Figure 3 – Sapphire resonator (open type) to measurethe surface resistance of superconductor films |
| 13 | 5.2.3 Superconductor films 6 Measurement procedure 6.1 Set-up 6.2 Measurement of the tan δ of the sapphire rod 6.2.1 General 6.2.2 Measurement of the frequency response of the TE021 mode Table 1 – Typical dimensions of the sapphire rod |
| 15 | 6.2.3 Measurement of the frequency response of the TE012 mode 6.2.4 Determination of tan δ of the sapphire rod Figure 4 – Reflection scattering parameters (|S11| and |S22|) |
| 16 | 6.3 Power dependence measurement 6.3.1 General |
| 17 | 6.3.2 Calibration of the incident microwave power to the resonator 6.3.3 Measurement of the reference level 6.3.4 Surface resistance measurement as a function of the incident microwave power 6.3.5 Determination of the maximum surface magnetic flux density |
| 18 | 7 Uncertainty of the test method 7.1 Surface resistance Table 2 – Specifications of the vector network analyzer |
| 19 | 7.2 Temperature Figure 5 – Term definitions in Table 3 Table 3 – Specifications of the sapphire rods |
| 20 | 7.3 Specimen and holder support structure 7.4 Specimen protection 8 Test report 8.1 Identification of the test specimen 8.2 Report of power dependence of Rs values 8.3 Report of test conditions |
| 21 | Annex A (informative) Additional information relating to Clauses 1 to 7 Figure A.1 – Three types of sapphire rod resonators |
| 22 | Figure A.2 – Mode chart for a sapphire resonator (see IEC 61788-15) |
| 23 | Figure A.3 – Loaded quality factor QL measurements usingthe conventional 3 dB method and the circle fit method |
| 24 | Figure A.4 – Temperature dependence of tan δ of a sapphire rod measured using the two-resonance mode dielectric resonator method [3] |
| 25 | Figure A.5 – Dependence of the surface resistance Rson the maximum surface magnetic flux density Bs max |
| 26 | Annex B (informative) Uncertainty considerations |
| 27 | Table B.1 – Output signals from two nominally identical extensometers Table B.2 – Mean values of two output signals Table B.3 – Experimental standard deviations of two output signals |
| 28 | Table B.4 – Standard uncertainties of two output signals Table B.5 – Coefficient of Variations of two output signals |
| 31 | Bibliography |
