BS EN 60749-3:2002
$86.31
Semiconductor devices. Mechanical and climatic test methods – External visual examination
| Published By | Publication Date | Number of Pages |
| BSI | 2002 | 8 |
Aims at verifying that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The contents of the corrigendum of August 2003 have been included in this copy.
