ASTM-F980 1992

$40.63

F980-92 Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

Published By	Publication Date	Number of Pages
ASTM	1992	8

Guaranteed Safe Checkout

Categories: 31.080.01 - Semiconductor devices in general, ASTM

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Description

ASTM F980-92

Historical Standard: Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

ASTM F980

Scope

1.1 This guide defines the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from neutron radiation. This test will produce degradation of the electrical properties of the irradiated devices and should be considered a destructive test. Rapid annealing of displacement damage is usually associated with bipolar technologies.

1.2 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of whoever uses this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific hazard information is given in 4.2.7.

Keywords

Annealing; Defects-semiconductors; Destructive testing-semiconductors; Displacement damage; Electrical conductors-semiconductors; Electronic hardness; Hardness tests-radiation (of semiconductors); Integrated circuits; Neutron radiation; Pulsed neutron-radiation source; Radiation exposure-electronic components/devices; Radiation-hardness testing; Short term damage; Vulnerability; rapid annealing of neutron-induced displacement damage in semiconductor; devices, guide,; Rapid annealing effects; neutron-induced displacement damage in semiconductor devices, guide

ICS Code

ICS Number Code 31.080.01 (Semi-conductor devices in general)

DOI:

Additional information

Standard Title	F980-92 Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Published Code	ASTM
Publication Date	1992
Pages Count	8
ICS Codes	31.080.01 - Semiconductor devices in general