BS IEC 62860:2013:2014 Edition

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Test methods for the characterization of organic transistors and materials

Published By	Publication Date	Number of Pages
BSI	2014	28

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Description

This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

PDF Catalog

PDF Pages	PDF Title
4	CONTENTS
11	1. Overview 1.1 Scope 1.2 Purpose
12	1.3 Electrical characterization overview
13	2. Definitions, acronyms, and abbreviations 2.1 Definitions
16	2.2 Acronyms and abbreviations 3. Standard OFET characterization procedures 3.1 Device structures
17	3.2 Guidelines for the OFET characterization process
18	3.3 Electrical standards
21	3.4 Reporting data
23	3.5 Environmental control and standards
24	Annex A (informative) Bibliography
25	Annex B (informative) IEEE List of Participants

Additional information

Status	Definitive
Pages	28
Publication Date	2014-08-31
ISBN	978 0 580 82727 3
Standard Number	BS IEC 62860:2013
Title	Test methods for the characterization of organic transistors and materials
Identical National Standard Of	IEC 62860:2013
Descriptors	Electronic equipment and components, Organic chemistry, Optoelectronic devices, Semiconductor devices
Publisher	BSI
Committee	NTI/1
ICS Codes	07.120 - Nanotechnologies

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BS IEC 62860:2013:2014 Edition

PDF Catalog

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