BS EN 61967-1:2002

$142.49

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz – General conditions and definitions

Published By	Publication Date	Number of Pages
BSI	2002	28

Guaranteed Safe Checkout

Category: BSI

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Description

Provides general information and definitions on measurement of conducted and radiated electromagnetic disturbances from integrated circuits. Also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. A test method comparison table is included to assist in selecting the appropriate measurement method(s). Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit.

Additional information

Status	Withdrawn
Title	Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz – General conditions and definitions
Publisher	BSI
Committee	EPL/47
Pages	28
Publication Date	2002-07-02
Withdrawn Date	2019-02-21
Replaced By	BS EN IEC 61967-1:2019
ISBN	0 580 39890 0
Standard Number	BS EN 61967-1:2002, IEC 61967-1:2002
Identical National Standard Of	IEC 61967-1:2002, EN 61967-1 (IEC 61967-1:2002) AS
Descriptors	Integrated circuits, Electromagnetic radiation, Electromagnetic tests, Radio disturbances, Test equipment, Electronic equipment and components, Noise (spurious signals), Radiofrequencies, Electrical testing, Circuits, Electromagnetic fields, Testing conditions
ICS Codes	31.200 - Integrated circuits. Microelectronics

Preview PDF


PDF Format	Searchable	Printable	Preview Now

BS EN 61967-1:2002

Related products