BS EN 60749-2:2002

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Semiconductor devices. Mechanical and climatic test methods – Low air pressure

Published By	Publication Date	Number of Pages
BSI	2002	10

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Description

Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only. The contents of the corrigendum of August 2003 have been included in this copy.

Additional information

Status	Definitive
Pages	10
Publication Date	2002-09-24
ISBN	0 580 40397 1
Partially Replaces	BS EN 60749:1999
Standard Number	BS EN 60749-2:2002
Title	Semiconductor devices. Mechanical and climatic test methods – Low air pressure
Identical National Standard Of	EN 60749-2:2002, IEC 60749-2:2002
Descriptors	Integrated circuits, Pressure, Electronic equipment and components, Semiconductor devices, Climate, Air, Low-pressure tests, Mechanical testing, Environmental testing
Publisher	BSI
Committee	EPL/47
ICS Codes	31.080.01 - Semiconductor devices in general

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BS EN 60749-2:2002

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