BS CECC 20000:1983

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Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices

Published By	Publication Date	Number of Pages
BSI	1983	100

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Description

Prescribes quality assessment procedures and test and measurement conditions applicable to semiconductor optoelectronic and liquid crystal devices.

Additional information

Status	Definitive
Related National Standard Of	IEC 60147
Title	Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices
Publisher	BSI
Committee	EPL/47
Pages	100
Publication Date	1983-06-30
Replaced By	BS EN 120000:1996
ISBN	0 580 11941 6
Standard Number	BS CECC 20000:1983
Identical National Standard Of	CECC 20000, CECC 20000:Supplement 1
Descriptors	Marking, Capacitance measurement, Optoelectronic devices, Couplers, Overvoltage tests, Wavelengths, Endurance testing, Optical measurement, Luminous intensity, Semiconductor devices, Radiometry, Light-emitting diodes, Light-emitting devices, Light distribution, Inspection, Surges (electrical), Electrical testing, Qualification approval, Testing conditions, Phototransistors, Quality assurance systems, Voltage measurement, Sampling methods, Electrical measurement, Solderability testing, Approval testing, Liquid crystal devices, Short-circuit current tests, Designations, Resistance measurement, Luminance, Radiant flux density, Circuits, Infrared radiation, Flashover, Assessed quality, Electronic equipment and components, Specification (approval), Bandwidths, Test equipment, Time measurement, Mechanical testing, Environmental testing, Thermal-cycling tests, Photodiodes, Performance testing, Current measurement, Orientation, Leak tests
ICS Codes	31.260 - Optoelectronics. Laser equipment

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BS CECC 20000:1983

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