Concat us[email protected]
Shopping Cart

No products in the cart.

🔍
ASTM-F775 1988

ASTM-F775 1988

$40.63

F775-88 Test Method for Wafer and Slice Flatness by Interferometric (Withdrawn 1991)

Published By Publication Date Number of Pages
ASTM 1988
PDF Format Searchable Printable Preview Now
Guaranteed Safe Checkout
Category:

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

ASTM F775-88

Withdrawn Standard: Test Method for Wafer and Slice Flatness by Interferometric (Withdrawn 1991)

ASTM F775

Scope

Keywords

ICS Code

ICS Number Code 29.045 (Semiconducting materials)

DOI:

ASTM-F775 1988
$40.63