{"id":47658,"date":"2024-10-17T07:45:55","date_gmt":"2024-10-17T07:45:55","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/astm-e1127-3\/"},"modified":"2024-10-24T16:15:43","modified_gmt":"2024-10-24T16:15:43","slug":"astm-e1127-3","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/astm\/astm-e1127-3\/","title":{"rendered":"ASTM-E1127"},"content":{"rendered":"<\/p>\n
1.1 This guide covers procedures used for depth profiling in Auger electron spectroscopy.<\/p>\n
1.2 Guidelines are given for depth profiling by the following:<\/p>\n
1.3 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.<\/i><\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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1<\/td>\n | Scope Referenced Documents Terminology Summary of Guide Significance and Use Ion Sputtering <\/td>\n<\/tr>\n | ||||||
2<\/td>\n | Angle Lapping and Cross-Sectioning <\/td>\n<\/tr>\n | ||||||
3<\/td>\n | Mechanical Cratering Nondestructive Depth Profiling FIG. 1 FIG. 2 <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | Keywords REFERENCES <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" E1127-03 Standard Guide for Depth Profiling in Auger Electron Spectroscopy<\/b><\/p>\n |