{"id":440544,"date":"2024-10-20T08:15:42","date_gmt":"2024-10-20T08:15:42","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-62228-32019-2\/"},"modified":"2024-10-26T15:26:23","modified_gmt":"2024-10-26T15:26:23","slug":"bs-en-iec-62228-32019-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-62228-32019-2\/","title":{"rendered":"BS EN IEC 62228-3:2019"},"content":{"rendered":"

IEC 62228-3:2019 specifies test and measurement methods for EMC evaluation of CAN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for CAN standard transceivers, CAN transceivers with partial networking functionality and CAN transceivers with flexible data rate capability and covers – the emission of RF disturbances, – the immunity against RF disturbances, – the immunity against impulses, and – the immunity against electrostatic discharges (ESD). This first edition cancels and replaces the first edition of IEC TS 62228 published in 2007 and constitutes a technical revision. This edition includes the following significant technical changes with respect to IEC TS 62228: a) introduction of CAN transceivers with partial networking functionality and CAN transceivers with flexible data rate capability and addition of operation modes and test descriptions in the respective subclauses of the document; b) introduction of minimal communication network with two CAN transceivers; c) update of the test requirements and targets in Annex C; d) addition of Annex D for common mode choke characterization.<\/p>\n

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2<\/td>\nundefined <\/td>\n<\/tr>\n
5<\/td>\nAnnex ZA(normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n
6<\/td>\nEnglish
CONTENTS <\/td>\n<\/tr>\n
10<\/td>\nFOREWORD <\/td>\n<\/tr>\n
12<\/td>\n1 Scope
2 Normative references <\/td>\n<\/tr>\n
13<\/td>\n3 Terms, definitions and abbreviated terms
3.1 Terms and definitions <\/td>\n<\/tr>\n
14<\/td>\n3.2 Abbreviated terms
4 General <\/td>\n<\/tr>\n
15<\/td>\n5 Test and operating conditions
5.1 Supply and ambient conditions
Tables
Table 1 \u2013 Overview of measurements and tests <\/td>\n<\/tr>\n
16<\/td>\n5.2 Test operation modes
5.3 Test configuration
5.3.1 General test configuration for transceiver network
Table 2 \u2013 Supply and ambient conditions for functional operation <\/td>\n<\/tr>\n
17<\/td>\n5.3.2 General test configuration for unpowered ESD test
Figures
Figure 1 \u2013 General test configuration for tests in transceiver network
Figure 2 \u2013 General test configuration for unpowered ESD test <\/td>\n<\/tr>\n
18<\/td>\n5.3.3 Transceiver network tests \u2013 Coupling ports and networks
Figure 3 \u2013 Transceiver network tests \u2013 Coupling ports and networks <\/td>\n<\/tr>\n
19<\/td>\n5.3.4 ESD tests \u2013 Coupling ports and networks
Table 3 \u2013 Transceiver network tests \u2013 Component value definitionsof coupling ports and networks <\/td>\n<\/tr>\n
20<\/td>\n5.4 Test signals
5.4.1 General
5.4.2 Test signals for normal operation mode
Figure 4 \u2013 Coupling ports and networks for ESD tests
Table 4 \u2013 Definitions of coupling ports for ESD tests <\/td>\n<\/tr>\n
21<\/td>\nTable 5 \u2013 Communication test signal TX1
Table 6 \u2013 Communication test signal TX2a <\/td>\n<\/tr>\n
22<\/td>\n5.4.3 Test signal for wake-up from low power mode
Table 7 \u2013 Communication test signal TX2b
Table 8 \u2013 Wake-up test signal TX3 <\/td>\n<\/tr>\n
23<\/td>\nTable 9 \u2013 Communication test signal TX4a
Table 10 \u2013 Communication test signal TX4b
Table 11 \u2013 Communication test signal TX4c <\/td>\n<\/tr>\n
24<\/td>\nTable 12 \u2013 Communication test signal TX4d
Table 13 \u2013 Communication test signal TX4e
Table 14 \u2013 Communication test signal TX4f1 <\/td>\n<\/tr>\n
25<\/td>\nTable 15 \u2013 Communication test signal TX4f2
Table 16 \u2013 Communication test signal TX4g
Table 17 \u2013 Communication test signal TX4h <\/td>\n<\/tr>\n
26<\/td>\n5.5 Evaluation criteria
5.5.1 General
5.5.2 Evaluation criteria for functional operation modes
Table 18 \u2013 Communication test signal TX4i <\/td>\n<\/tr>\n
27<\/td>\nTable 19 \u2013 Evaluation criteria for CAN transceiver standard functions
Table 20 \u2013 Evaluation criteria for CAN transceivers with partial networking functionality <\/td>\n<\/tr>\n
28<\/td>\nTable 21 \u2013 Specific definition for test procedure for evaluationof CAN transceiver partial networking function <\/td>\n<\/tr>\n
29<\/td>\nTable 22 \u2013 Evaluation criteria for CAN transceivers with flexible data rate capability <\/td>\n<\/tr>\n
30<\/td>\nFigure 5 \u2013 Definition for trigger points and violation masksfor CAN transceivers with flexible data rate capability <\/td>\n<\/tr>\n
31<\/td>\nTable 23 \u2013 Definitions for violation masks for CAN transceiverswith flexible data rate capability <\/td>\n<\/tr>\n
32<\/td>\n5.5.3 Evaluation criteria in unpowered condition after exposure to disturbances
Figure 6 \u2013 Principal drawing of the maximum deviation on an IV characteristic <\/td>\n<\/tr>\n
33<\/td>\n5.5.4 Status classes
6 Test and measurement
6.1 Emission of RF disturbances
6.1.1 Test method
6.1.2 Test setup
Table 24 \u2013 Definition of functional status classes <\/td>\n<\/tr>\n
34<\/td>\n6.1.3 Test procedure and parameters
Figure 7 \u2013 Test setup for measurement of RF disturbances <\/td>\n<\/tr>\n
35<\/td>\n6.2 Immunity to RF disturbances
6.2.1 Test method
6.2.2 Test setup
Table 25 \u2013 Settings of the RF measurement equipment
Table 26 \u2013 RF emission measurements <\/td>\n<\/tr>\n
36<\/td>\n6.2.3 Test procedure and parameters
Figure 8 \u2013 Test setup for DPI tests <\/td>\n<\/tr>\n
37<\/td>\nTable 27 \u2013 Specifications for DPI tests <\/td>\n<\/tr>\n
38<\/td>\nTable 28 \u2013 DPI tests for functional status class AIC evaluation of CAN transceiver standard function <\/td>\n<\/tr>\n
39<\/td>\nTable 29 \u2013 DPI tests for functional status class AIC evaluation of CAN transceiver partial networking function <\/td>\n<\/tr>\n
40<\/td>\nTable 30 \u2013 DPI tests for functional status class AIC evaluation of CAN transceiver CAN FD function
Table 31 \u2013 DPI tests for functional status class CIC or DIC evaluation of CAN transceivers <\/td>\n<\/tr>\n
41<\/td>\n6.3 Immunity to impulses
6.3.1 Test method
6.3.2 Test setup
Figure 9 \u2013 Test setup for impulse immunity tests <\/td>\n<\/tr>\n
42<\/td>\n6.3.3 Test procedure and parameters
Table 32 \u2013 Specifications for impulse immunity tests
Table 33 \u2013 Parameters for impulse immunity test <\/td>\n<\/tr>\n
43<\/td>\nTable 34 \u2013 Impulse immunity tests for functional status class AIC evaluation of CAN transceiver standard function <\/td>\n<\/tr>\n
44<\/td>\nTable 35 \u2013 Impulse immunity tests for functional status class AIC evaluation of CAN transceiver partial networking function
Table 36 \u2013 Impulse immunity tests for functional status class AIC evaluation of CAN transceiver CAN FD function <\/td>\n<\/tr>\n
45<\/td>\n6.4 Electrostatic discharge (ESD)
6.4.1 Test method
6.4.2 Test setup
Table 37 \u2013 Impulse immunity tests for functional statusclass CIC or DIC evaluation of CAN transceivers <\/td>\n<\/tr>\n
46<\/td>\nFigure 10 \u2013 Test setup for direct ESD tests \u2013 Principal arrangement <\/td>\n<\/tr>\n
47<\/td>\n6.4.3 Test procedure and parameters
Figure 11 \u2013 Test setup for direct ESD tests \u2013 Stimulation and monitoring
Table 38 \u2013 Specifications for direct ESD tests <\/td>\n<\/tr>\n
48<\/td>\n7 Test report
Table 39 \u2013 ESD tests in unpowered mode for functionalstatus class DIC evaluation of CAN transceivers <\/td>\n<\/tr>\n
49<\/td>\nAnnex A (normative)CAN test circuits
A.1 General
A.2 Test circuit for CAN transceivers for functional tests <\/td>\n<\/tr>\n
51<\/td>\nFigure A.1 \u2013 General drawing of the circuit diagram of test networkfor CAN standard transceivers for functional test <\/td>\n<\/tr>\n
53<\/td>\nA.3 Test circuit for CAN transceiver for ESD test
Figure A.2 \u2013 General drawing of the circuit diagram of test network for CAN PN transceivers for functional test <\/td>\n<\/tr>\n
54<\/td>\nFigure A.3 \u2013 General drawing of the circuit diagram for direct ESD tests of CAN transceivers in unpowered mode <\/td>\n<\/tr>\n
55<\/td>\nAnnex B (normative)Test circuit boards
B.1 Test circuit board for functional tests
B.2 ESD test
Figure B.1 \u2013 Example of IC interconnections of CAN signal <\/td>\n<\/tr>\n
56<\/td>\nFigure B.2 \u2013 Example of ESD test board for CAN transceivers
Table B.1 \u2013 Parameters of ESD test circuit board <\/td>\n<\/tr>\n
57<\/td>\nAnnex C (informative)Examples for test limits for CAN transceiverin automotive application
C.1 General
C.2 Emission of RF disturbances
Figure C.1 \u2013 Example of limits for RF emission \u2013 CAN with bus filter <\/td>\n<\/tr>\n
58<\/td>\nC.3 Immunity to RF disturbances
Figure C.2 \u2013 Example of limits for RF emission \u2013 Other global pins
Figure C.3 \u2013 Example of limits for RF emission \u2013 Local supplies <\/td>\n<\/tr>\n
59<\/td>\nFigure C.4 \u2013 Example of limits for RF immunity for functionalstatus class AIC \u2013 CAN with bus filter
Figure C.5 \u2013 Example of limits for RF immunity for functional status class AIC \u2013 CAN <\/td>\n<\/tr>\n
60<\/td>\nFigure C.6 \u2013 Example of limits for RF immunity for functionalstatus class AIC \u2013 Other global pins
Figure C.7 \u2013 Example of limits for RF immunity for functionalstatus class CIC or DIC \u2013 CAN with bus filter <\/td>\n<\/tr>\n
61<\/td>\nC.4 Immunity to impulses
C.5 Electrostatic discharge (ESD)
Figure C.8 \u2013 Example of limits for RF immunity for functionalstatus class CIC or DIC \u2013 Other global pins
Table C.1 \u2013 Example of limits for impulse immunity for functional status class CIC or DIC <\/td>\n<\/tr>\n
62<\/td>\nAnnex D (informative)Characterization of common mode choke for CAN bus interfaces
D.1 General
D.2 Abbreviations
D.3 CMC test
D.3.1 General <\/td>\n<\/tr>\n
63<\/td>\nD.3.2 Leakage inductance mismatch measurement
Figure D.1 \u2013 General electrical drawing of a CMC
Figure D.2 \u2013 Test setup for 2-port S-parameter measurements for leakage inductance evaluation <\/td>\n<\/tr>\n
64<\/td>\nFigure D.3 \u2013 Example of a two-port test boardfor CMC leakage inductance characterization <\/td>\n<\/tr>\n
65<\/td>\nTable D.1 \u2013 Test procedure and parameters for leakage inductance evaluation <\/td>\n<\/tr>\n
66<\/td>\nTable D.2 \u2013 Leakage inductance measurements <\/td>\n<\/tr>\n
67<\/td>\nD.3.3 S-parameter measurement mixed mode
Figure D.4 \u2013 Example of CMC characterization measurement results
Table D.3 \u2013 Leakage inductance mismatch classes <\/td>\n<\/tr>\n
68<\/td>\nFigure D.5 \u2013 Test setup for S-parameter measurements
Table D.4 \u2013 Test procedure and parameters for 3-port test board characterization <\/td>\n<\/tr>\n
69<\/td>\nFigure D.6 \u2013 Example test board S-parameter measurement \u2013 Mixed mode, top layer
Figure D.7 \u2013 Example test board S-parameter measurement \u2013 Single ended, top layer <\/td>\n<\/tr>\n
70<\/td>\nTable D.5 \u2013 Test procedure and parameters for S-parameter measurements <\/td>\n<\/tr>\n
71<\/td>\nFigure D.8 \u2013 Recommended characteristics for Sdd21 (IL)
Table D.6 \u2013 Required S-parameter measurements <\/td>\n<\/tr>\n
72<\/td>\nD.3.4 ESD damage
Figure D.9 \u2013 Recommended characteristic for Scc21 (CMR)
Figure D.10 \u2013 Recommended characteristic for Ssd21 and Ssd12 (DCMR) <\/td>\n<\/tr>\n
73<\/td>\nFigure D.11 \u2013 Test setup for ESD damage tests <\/td>\n<\/tr>\n
74<\/td>\nFigure D.12 \u2013 Example test board ESD, top layer
Table D.7 \u2013 Test parameters for ESD damage tests <\/td>\n<\/tr>\n
75<\/td>\nD.3.5 Saturation test at RF disturbances
Figure D.13 \u2013 Test setup for RF saturation measurements
Table D.8 \u2013 Required ESD tests for damage <\/td>\n<\/tr>\n
76<\/td>\nFigure D.14 \u2013 Example RF saturation\/S-parameter test board, top layer
Table D.9 \u2013 Test procedure and parameters for RF saturation tests <\/td>\n<\/tr>\n
77<\/td>\nTable D.10 \u2013 Required RF saturation tests <\/td>\n<\/tr>\n
78<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Integrated circuits. EMC evaluation of transceivers – CAN transceivers<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2023<\/td>\n80<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":440553,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-440544","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/440544","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/440553"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=440544"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=440544"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=440544"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}