{"id":431417,"date":"2024-10-20T07:28:06","date_gmt":"2024-10-20T07:28:06","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-60115-12023-tc\/"},"modified":"2024-10-26T14:11:54","modified_gmt":"2024-10-26T14:11:54","slug":"bs-en-iec-60115-12023-tc","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-60115-12023-tc\/","title":{"rendered":"BS EN IEC 60115-1:2023 – TC"},"content":{"rendered":"

IEC 60115-1:2020 is a generic specification and is applicable to fixed resistors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.This edition contains the following significant technical changes with respect to the previous edition: <\/p>\n

    \n
  1. this 5th edition employs a new document structure, where the tests of prior Clause 4 are given in Clauses 6 to 12 now, with an informative Annex X providing cross-references for references to the prior revision of this standard;<\/li>\n
  2. the terms and definitions have been revised and amended, supplemented by a new section on resistor technologies and a new section on product classification levels;<\/li>\n
  3. a new Subclause 4.7 on recommendations for permissible substitutions has been added;<\/li>\n
  4. the provisions for packaging, storage and transportation in Subclauses 4.8, 4.9 and 4.10 have been completely revised;<\/li>\n
  5. a new Subclause 5.3 on default tolerances for the most common test parameters has been added;<\/li>\n
  6. the generic method of measuring resistance, now Sublause 5.6, has been separated from the test for compliance with a prescribed resistance value in 6.1, as a revision of the prior 4.5;<\/li>\n
  7. the test for the temperature coefficient of resistance of Subclause 6.2 is a revision of the prior test 4.8, variation of resistance with temperature, where the special concessions for resistors below 10 ? have been waived;<\/li>\n
  8. the test methods for endurance testing of Subclauses 7.1 to 7.3 (prior 4.25.1 to 4.25.3) have been completely revised;<\/li>\n
  9. the single?pulse high?voltage overload test of Subclause 8.2 (prior 4.27) has been completely revised, and now offers adjustable severities for the 1,2\/50 and for the 10\/700 pulse shape for the benefit of detail specifications with improved significance;<\/li>\n
  10. the periodic-pulse high-voltage overload test of Subclause 8.3 (prior 4.28) has been revised and a corrected table of severities provided;<\/li>\n
  11. the period-pulse overload test of Subclause 8.4 (prior 4.39) has been deprecated and streamlined to only offer the severity historically applied in subordinate specifications;<\/li>\n
  12. the Subclauses 9.1 on visual inspection, 9.2 on the gauging of dimensions, and 9.3 on the assessment of detail dimensions (all parts of prior 4.4) have been completely revised;<\/li>\n
  13. the tests for robustness of terminations (prior 4.16) have been revised and separated into tests for the robustness of solderable terminations, Subclause 9.5, and tests for the robustness of threaded stud or screw terminations, Subclause 9.6;<\/li>\n
  14. the bump test of Subclause 9.9 (prior 4.20) and the shock test of Subclause 9.10 (prior 4.21) have been revised to reflect the merged relevant test standard IEC 60068-2-29;<\/li>\n
  15. the dry heat and cold test of the climatic sequence of Subclause 10.3 (prior 4.23) have been revised to reflect the changes of the relevant test standards IEC 60068?2?2 and IEC 60068?2?1;<\/li>\n
  16. the accelerated damp heat, steady state test of Subclause 10.5 (prior 4.37) has been amended with an option for a reduced number of bias voltages;<\/li>\n
  17. the corrosion test of Subclause 10.6 has been completely revised in order to employ the better suitable test method of IEC 60068-2-52 instead of the prior used IEC 60068-2-11;<\/li>\n
  18. the whisker growth test of Subclause 10.7 has been revised to reflect the changes of the new revision of the test methods of IEC 60068-2-82;<\/li>\n
  19. the test methods for solderability of Subclause 11.1 (prior 4.17) and for resistance to soldering heat of Subclause 11.2 (prior 4.18) have been completely revised to incorporate the necessary option for the variety of lead-bearing and lead-free solder alloys and respective process conditions;<\/li>\n
  20. the solvent resistance test of Subclause 11.3 combines the prior tests 4.29, component solvent resistance, and 4.30, solvent resistance of marking, in one test;<\/li>\n
  21. the accidental overload test of Subclause 12.3 (prior 4.26) has been completely revised;<\/li>\n
  22. the Annex Q on quality assessment procedures has been completely revised;<\/li>\n
  23. a new Annex R on failure rate evaluation, determination and qualification has been added.<\/li>\n<\/ol>\n

    PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
    PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
    248<\/td>\nundefined <\/td>\n<\/tr>\n
    250<\/td>\nEuropean foreword <\/td>\n<\/tr>\n
    252<\/td>\n11 Addition of Annex ZA <\/td>\n<\/tr>\n
    255<\/td>\n12 Addition of a new Annex ZX
    Table ZX.1 \u2014 Cross-references for references to clauses <\/td>\n<\/tr>\n
    257<\/td>\nTable ZX.2 \u2014 Cross-references for references to figures <\/td>\n<\/tr>\n
    258<\/td>\nTable ZX.3 \u2014 Cross reference for references to tables <\/td>\n<\/tr>\n
    259<\/td>\nEnglish
    CONTENTS <\/td>\n<\/tr>\n
    263<\/td>\nFOREWORD <\/td>\n<\/tr>\n
    266<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
    267<\/td>\nFigures
    Figure 1 \u2013 Hierarchical system of specifications <\/td>\n<\/tr>\n
    268<\/td>\n1 Scope
    2 Normative references <\/td>\n<\/tr>\n
    270<\/td>\n3 Terms, definitions, product technologies and product classifications
    3.1 Terms and definitions <\/td>\n<\/tr>\n
    271<\/td>\nFigure 2 \u2013 Voltage and dissipation on a resistor below and above its critical resistance <\/td>\n<\/tr>\n
    277<\/td>\n3.2 Product technologies <\/td>\n<\/tr>\n
    280<\/td>\n3.3 Resistor encapsulations <\/td>\n<\/tr>\n
    281<\/td>\n3.4 Product classification <\/td>\n<\/tr>\n
    282<\/td>\n4 General requirements
    4.1 Units and symbols
    4.2 Preferred values <\/td>\n<\/tr>\n
    283<\/td>\n4.3 Coding
    4.4 Marking of the resistors
    4.5 Marking of the packaging <\/td>\n<\/tr>\n
    284<\/td>\n4.6 Ordering designation
    4.7 Permissible substitutions <\/td>\n<\/tr>\n
    285<\/td>\n4.8 Packaging <\/td>\n<\/tr>\n
    286<\/td>\n4.9 Storage
    4.10 Transportation <\/td>\n<\/tr>\n
    287<\/td>\n5 General provisions for measurements and test methods
    5.1 General
    5.2 Standard atmospheric conditions
    Tables
    Table 1 \u2013 Reference atmospheric conditions <\/td>\n<\/tr>\n
    288<\/td>\nTable 2 \u2013 Referee atmospheric conditions
    Table 3 \u2013 Standard atmospheric conditions for testing <\/td>\n<\/tr>\n
    289<\/td>\n5.3 Tolerances on test severity parameters
    Table 4 \u2013 Controlled atmospheric conditions for recovery
    Table 5 \u2013 Default tolerances on temperature specifications
    Table 6 \u2013 Default tolerances on voltage specifications <\/td>\n<\/tr>\n
    290<\/td>\n5.4 Drying
    5.5 Mounting of specimens
    Table 7 \u2013 Default tolerances on duration specifications
    Table 8 \u2013 Specimen drying procedures <\/td>\n<\/tr>\n
    292<\/td>\n5.6 Measurement of resistance
    Table 9 \u2013 Voltages for resistance measurement <\/td>\n<\/tr>\n
    293<\/td>\nFigure 3 \u2013 Standard measurement points on a leaded resistor
    Figure 4 \u2013 Standard measurement points on an SMD resistor <\/td>\n<\/tr>\n
    294<\/td>\n6 Electrical measurements and tests
    6.1 Resistance
    Figure 5 \u2013 Measurement points on an assembled SMD resistor <\/td>\n<\/tr>\n
    295<\/td>\nFigure 6 \u2013 Permissible resistance range due to tolerance <\/td>\n<\/tr>\n
    296<\/td>\n6.2 Temperature coefficient of resistance
    Figure 7 \u2013 Permissible resistance range due to tolerance and TCR
    Figure 8 \u2013 Variation of resistance with temperature (example) <\/td>\n<\/tr>\n
    297<\/td>\nTable 10 \u2013 Sequence of temperatures and measurements <\/td>\n<\/tr>\n
    299<\/td>\n6.3 Inductance <\/td>\n<\/tr>\n
    300<\/td>\nFigure 9 \u2013 Test circuit for measurement of the inductance <\/td>\n<\/tr>\n
    301<\/td>\n6.4 Voltage coefficient of resistance
    Figure 10 \u2013 Exponential voltage rise caused by inductance <\/td>\n<\/tr>\n
    302<\/td>\n6.5 Nonlinearity <\/td>\n<\/tr>\n
    303<\/td>\n6.6 Current noise <\/td>\n<\/tr>\n
    304<\/td>\n6.7 Temperature rise <\/td>\n<\/tr>\n
    305<\/td>\n7 Endurance tests
    7.1 Endurance at the rated temperature 70 \u00b0C <\/td>\n<\/tr>\n
    306<\/td>\nFigure 11 \u2013 Standard derating curve for the rated dissipation P70 <\/td>\n<\/tr>\n
    307<\/td>\n7.2 Endurance at room temperature <\/td>\n<\/tr>\n
    310<\/td>\nFigure 12 \u2013 Derating curve with specification of a suitable test dissipation
    Figure 13 \u2013 Derating curve without specification of a suitable test dissipation <\/td>\n<\/tr>\n
    312<\/td>\n7.3 Endurance at a maximum temperature <\/td>\n<\/tr>\n
    314<\/td>\nFigure 14 \u2013 Derating curve for UCT \u2265 MET
    Figure 15 \u2013 Derating curve for UCT < MET <\/td>\n<\/tr>\n
    316<\/td>\n8 Electrical overload tests
    8.1 Short-term overload <\/td>\n<\/tr>\n
    318<\/td>\n8.2 Single-pulse high-voltage overload test <\/td>\n<\/tr>\n
    319<\/td>\nFigure 16 \u2013 Parameters of an open-circuit lightning impulse voltage <\/td>\n<\/tr>\n
    320<\/td>\nFigure 17 \u2013 Circuit for generation of 1,2\/50 pulses <\/td>\n<\/tr>\n
    321<\/td>\nFigure 18 \u2013 Circuit for generation of 10\/700 pulses <\/td>\n<\/tr>\n
    322<\/td>\nTable 11 \u2013 Severities for the single-pulse high-voltage overload test <\/td>\n<\/tr>\n
    323<\/td>\n8.3 Periodic-pulse high-voltage overload test <\/td>\n<\/tr>\n
    325<\/td>\n8.4 Periodic-pulse overload test
    Table 12 \u2013 Severities for the periodic-pulse high-voltage overload test <\/td>\n<\/tr>\n
    327<\/td>\n8.5 Electrostatic discharge <\/td>\n<\/tr>\n
    328<\/td>\n9 Mechanical measurements and tests
    9.1 Visual examination <\/td>\n<\/tr>\n
    329<\/td>\n9.2 Gauging of dimensions <\/td>\n<\/tr>\n
    330<\/td>\n9.3 Detail dimensions <\/td>\n<\/tr>\n
    331<\/td>\n9.4 Robustness of the resistor body <\/td>\n<\/tr>\n
    332<\/td>\n9.5 Robustness of terminations
    Figure 19 \u2013 Testing of resistor body robustness <\/td>\n<\/tr>\n
    333<\/td>\nTable 13 \u2013 Tensile test force for wire terminations <\/td>\n<\/tr>\n
    335<\/td>\n9.6 Robustness of threaded stud or screw terminations
    Table 14 \u2013 Test torque for threaded studs, screws and integral mounting devices <\/td>\n<\/tr>\n
    336<\/td>\n9.7 Shear test <\/td>\n<\/tr>\n
    337<\/td>\nFigure 20 \u2013 Shear test for SMD resistors <\/td>\n<\/tr>\n
    338<\/td>\n9.8 Substrate bending test
    Table 15 \u2013 Recommended parameters for the substrate bending test <\/td>\n<\/tr>\n
    339<\/td>\nFigure 21 \u2013 Substrate bending test for SMD resistors <\/td>\n<\/tr>\n
    340<\/td>\n9.9 Bump <\/td>\n<\/tr>\n
    341<\/td>\n9.10 Shock
    Table 16 \u2013 Recommended parameters for the bump test <\/td>\n<\/tr>\n
    342<\/td>\n9.11 Vibration
    Table 17 \u2013 Recommended parameters for the shock test <\/td>\n<\/tr>\n
    343<\/td>\nTable 18 \u2013 Recommended parameters for the vibration test <\/td>\n<\/tr>\n
    344<\/td>\n10 Environmental and climatic tests
    10.1 Rapid change of temperature <\/td>\n<\/tr>\n
    345<\/td>\n10.2 Operation at low temperature
    Table 19 \u2013 Recommended parameters for the rapid change of temperature test <\/td>\n<\/tr>\n
    346<\/td>\n10.3 Climatic sequence <\/td>\n<\/tr>\n
    348<\/td>\nTable 20 \u2013 Number of additional damp heat cycles <\/td>\n<\/tr>\n
    349<\/td>\n10.4 Damp heat, steady state <\/td>\n<\/tr>\n
    350<\/td>\nTable 21 \u2013 Severity parameters for the damp heat, steady state test <\/td>\n<\/tr>\n
    351<\/td>\nTable 22 \u2013 Bias voltage for the damp heat, steady state test <\/td>\n<\/tr>\n
    352<\/td>\n10.5 Damp heat, steady state, accelerated <\/td>\n<\/tr>\n
    353<\/td>\nTable 23 \u2013 Severity parameters for the accelerated damp heat, steady state test <\/td>\n<\/tr>\n
    354<\/td>\n10.6 Corrosion
    Table 24 \u2013 Grouped DC bias voltages for < 25 % deviation <\/td>\n<\/tr>\n
    355<\/td>\nTable 25 \u2013 Recommended parameters for the corrosion test <\/td>\n<\/tr>\n
    356<\/td>\n10.7 Whisker growth test <\/td>\n<\/tr>\n
    357<\/td>\n10.8 Hydrogen sulphide test
    Table 26 \u2013 Test methods and parameters for the whisker growth test <\/td>\n<\/tr>\n
    358<\/td>\n11 Tests related to component assembly
    11.1 Solderability
    Table 27 \u2013 Selection of accelerated ageing methods of IEC 60068-2-20 <\/td>\n<\/tr>\n
    359<\/td>\nTable 28 \u2013 Process temperatures for selected solder alloy examples <\/td>\n<\/tr>\n
    360<\/td>\nTable 29 \u2013 Solderability test parameters for SMD resistors <\/td>\n<\/tr>\n
    361<\/td>\nTable 30 \u2013 Solderability test parameters for resistors with wire or tag terminations <\/td>\n<\/tr>\n
    362<\/td>\n11.2 Resistance to soldering heat <\/td>\n<\/tr>\n
    363<\/td>\nTable 31 \u2013 Resistance to soldering heat test parameters for SMD resistors
    Table 32 \u2013 RSH test parameters for resistors with wire or tag terminations <\/td>\n<\/tr>\n
    364<\/td>\n11.3 Solvent resistance <\/td>\n<\/tr>\n
    366<\/td>\n12 Tests related to safety
    12.1 Insulation resistance
    Table 33 \u2013 Recommended parameters for the solvent resistance test <\/td>\n<\/tr>\n
    367<\/td>\nFigure 22 \u2013 V-block fixture <\/td>\n<\/tr>\n
    368<\/td>\nFigure 23 \u2013 Foil method applied to a resistor specimen
    Figure 24 \u2013 Mounting method applied to a resistor specimen <\/td>\n<\/tr>\n
    369<\/td>\nFigure 25 \u2013 Parallel clamp fixture for rectangular SMD resistors <\/td>\n<\/tr>\n
    370<\/td>\nFigure 26 \u2013 V-clamp test fixture for cylindrical SMD resistors <\/td>\n<\/tr>\n
    371<\/td>\n12.2 Voltage proof
    Table 34 \u2013 Insulation resistance measuring voltage <\/td>\n<\/tr>\n
    372<\/td>\n12.3 Accidental overload test <\/td>\n<\/tr>\n
    374<\/td>\nFigure 27 \u2013 Gauze fixture for axial cylindrical specimens <\/td>\n<\/tr>\n
    375<\/td>\nFigure 28 \u2013 Gauze fixture dimensions for cylindrical specimens <\/td>\n<\/tr>\n
    376<\/td>\nFigure 29 \u2013 Gauze fixture dimensions for non-cylindrical specimens <\/td>\n<\/tr>\n
    377<\/td>\n12.4 Flammability
    Table 35 \u2013 Recommended parameters for the accidental overload test <\/td>\n<\/tr>\n
    378<\/td>\n13 Quality assessment procedures <\/td>\n<\/tr>\n
    380<\/td>\nAnnexes
    Annex A (normative) Symbols and abbreviated terms <\/td>\n<\/tr>\n
    386<\/td>\nAnnex B (normative) Rules for the preparation of detail specifications for resistors and capacitors for electronic equipment for use within the IECQ system <\/td>\n<\/tr>\n
    387<\/td>\nAnnex C (informative) Example of a certified test record <\/td>\n<\/tr>\n
    389<\/td>\nAnnex Q (informative) Quality assessment procedures
    Q.1 General <\/td>\n<\/tr>\n
    393<\/td>\nQ.2 IECQ Approved Component (IECQ AC) procedures <\/td>\n<\/tr>\n
    394<\/td>\nQ.3 IECQ Qualification Approval (QA) procedures <\/td>\n<\/tr>\n
    395<\/td>\nQ.4 IECQ Approved Component \u2013 Capability Certification (IECQ AC-C) procedures <\/td>\n<\/tr>\n
    397<\/td>\nQ.5 IECQ Approved Component \u2013 Technology Certification (IECQ AC-TC) procedure <\/td>\n<\/tr>\n
    400<\/td>\nAnnex R (informative) Failure rate level evaluation, determination and qualification
    R.1 General <\/td>\n<\/tr>\n
    401<\/td>\nR.2 Certification and determination of a failure rate level <\/td>\n<\/tr>\n
    402<\/td>\nTable R.1 \u2013 Requirements for the qualification of a failure rate level <\/td>\n<\/tr>\n
    403<\/td>\nR.3 Non-conformances
    R.4 Extension of a qualification to a higher failure rate level
    R.5 Maintenance of a failure rate level <\/td>\n<\/tr>\n
    404<\/td>\nR.6 Deliveries
    Table R.2 \u2013 Requirements for the maintenance of a failure rate level qualification <\/td>\n<\/tr>\n
    405<\/td>\nR.7 Determination of a component failure rate <\/td>\n<\/tr>\n
    407<\/td>\nTable R.3 \u2013 Environmental factor \u03c0E for determination of the component failure rate
    Table R.4 \u2013 Quality factor \u03c0Q for determination of the component failure rate <\/td>\n<\/tr>\n
    408<\/td>\nAnnex X (informative)Cross-references for references to the prior revision of this document
    Table X.1 \u2013 Cross-references for references to clauses (1 of 3) <\/td>\n<\/tr>\n
    409<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

    Tracked Changes. Fixed resistors for use in electronic equipment – Generic specification<\/b><\/p>\n\n\n\n\n
    Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
    BSI<\/b><\/a><\/td>\n2023<\/td>\n412<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":431427,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[558,2641],"product_tag":[],"class_list":{"0":"post-431417","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-040-10","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/431417","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/431427"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=431417"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=431417"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=431417"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}