{"id":352130,"date":"2024-10-20T00:50:51","date_gmt":"2024-10-20T00:50:51","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iso-iec-tr-291982013\/"},"modified":"2024-10-26T00:48:47","modified_gmt":"2024-10-26T00:48:47","slug":"bsi-pd-iso-iec-tr-291982013","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iso-iec-tr-291982013\/","title":{"rendered":"BSI PD ISO\/IEC TR 29198:2013"},"content":{"rendered":"

This Technical Report provides guidance on estimating how \u201cchallenging\u201c or \u201cstressing\u201c is an evaluation dataset for fingerprint recognition, based on relative sample quality, relative rotation, deformation, and overlap between impressions. In addition, this Technical Report establishes a method for construction of datasets of different levels of difficulty. This Technical Report defines the relative level of difficulty of a fingerprint dataset used in technology evaluation of fingerprint recognition algorithms. Level of difficulty is based on differences between reference and probe samples in the aformentioned factors. This Technical Report addresses such issues as:<\/p>\n