{"id":233249,"date":"2024-10-19T15:12:05","date_gmt":"2024-10-19T15:12:05","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-62132-82012\/"},"modified":"2024-10-25T09:40:57","modified_gmt":"2024-10-25T09:40:57","slug":"bs-en-62132-82012","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-62132-82012\/","title":{"rendered":"BS EN 62132-8:2012"},"content":{"rendered":"
IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz. This publication is to be read in conjunction with \/2.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
6<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 4 General 5 Test conditions 5.1 General <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 5.2 Supply voltage 5.3 Frequency range 6 Test equipment 6.1 General 6.2 Cables 6.3 Shielding 6.4 RF disturbance generator 6.5 IC stripline 6.6 50 \u2126 termination 6.7 DUT monitor <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 7 Test setup 7.1 General 7.2 Test configuration 7.3 EMC test board (PCB) 8 Test procedure 8.1 General Figures Figure 1 \u2013 IC stripline test setup <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 8.2 Operational check 8.3 Immunity measurement 8.3.1 General 8.3.2 RF disturbance signal 8.3.3 Test frequency steps and ranges 8.3.4 Test levels and dwell time 8.3.5 DUT monitoring Tables Table 1 \u2013 Frequency step size versus frequency range <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 8.3.6 Detail procedure 9 Test report 10 RF immunity acceptance level <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | Annex A (normative) Field strength determination Figure A.1 \u2013 Definition of height (h) and width (w) of IC stripline <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | Figure A.2 \u2013 EM field distribution <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | Annex B (normative) IC stripline descriptions Figure B.1 \u2013 Cross section view of an example of an open IC stripline <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | Figure B.2 \u2013 Cross section view of an example of a closed IC stripline Table B.1 \u2013 Maximum DUT dimensions for 6,7 mm IC stripline (Open version) Table B.2 \u2013 Maximum DUT dimensions for 6,7 mm IC stripline (Closed version) <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | Figure B.3 \u2013 Example of IC stripline with housing <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | Annex C (informative) Closed stripline geometrical limitations <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | Table C.1 \u2013 Height of shielding, simulated at hbottom\u00a0=\u00a06,7mm to achieve practically 50\u00a0\u2126 system <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | Figure C.1 \u2013 Calculated H-field reduction of closed version referencedto referring open version as a function of portion of active conductorwidth of closed version to open version <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | Figure C.2 \u2013 Location of currents and mirrored currents at grounded planes used for calculation of fields <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Integrated circuits. Measurement of electromagnetic immunity – Measurement of radiated immunity. IC stripline method<\/b><\/p>\n |