IEEE 592 2008
$46.04
IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors
| Published By | Publication Date | Number of Pages |
| IEEE | 2008 | 14 |
Revision Standard – Active. Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std 592-2007 Front cover |
| 3 | Title Page |
| 6 | Introduction Notice to users Laws and regulations Copyrights |
| 7 | Updating of IEEE documents Errata Interpretations Patents |
| 8 | Participants |
| 10 | Contents |
| 11 | IMPORTANT NOTICE 1. Scope 2. Normative references |
| 12 | 3. Performance requirements 4. Test procedures |
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