If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7. Email:[email protected]
Documents the parametrized MOS test structures of the device model Parameter extraction Test Chip (PTC) of the European Mini Test Chip (ETC).
Status
Withdrawn
Pages
22
Publication Date
1996-09-15
Withdrawn Date
2012-04-20
ISBN
0 580 26179 4
Standard Number
DD ENV 50218:1996
Title
Description of a parametrized European mini test chip
Identical National Standard Of
ENV 50218:1996
Descriptors
Test equipment, Reliability, Metal oxide semiconductors, Transistors, Electronic equipment and components, Microprocessor chips, Semiconductor devices, Digital integrated circuits, Assessed reliability, Computer applications, Integrated circuits
