BSI 18/30362458 DC:2018 Edition
$13.70
BS IEC 60747-14-11. Semiconductor devices – Part 14-11. Semiconductor sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature
| Published By | Publication Date | Number of Pages |
| BSI | 2018 | 28 |
| Status | Definitive |
|---|---|
| Pages | 28 |
| Publication Date | 2018-06-22 |
| Standard Number | 18/30362458 DC |
| Title | BS IEC 60747-14-11. Semiconductor devices – Part 14-11. Semiconductor sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature |
| Identical National Standard Of | IEC 60747-14-11 Ed.1.0, IEC 60747-14-11 Ed.1.0 |
| Descriptors | Semiconductor devices, Water-vapour tests, Mechanical testing, Environmental testing, Electronic equipment and components, Climate, Moisture measurement, Water vapour, Integrated circuits |
| Publisher | BSI |
| Committee | EPL/47 |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
