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UNE-EN 62047-13:2012

UNE-EN 62047-13:2012

$20.80

Semiconductor devices – Micro-electromechanical devices – Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures

Published By Publication Date Number of Pages
AENOR 2012-06-01 18
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Published Code

AENOR
Published By

Asociación Española de Normalización
Publication Date

2012-06-01
Pages Count

18
Language

English
File Size

593.9 KB
ICS Codes 31.080.99 - Other semiconductor devices
UNE-EN 62047-13:2012
$20.80